Supercharge Your Innovation With Domain-Expert AI Agents!

Fractional n-type PLL circuit

A phase-locked loop and circuit technology, which is applied to electrical components, generation/distribution signals, automatic power control, etc., can solve problems such as phase-locked loop output jitter

Active Publication Date: 2018-08-31
LATTICE SEMICON CORP
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

A sigma-delta modulator type fractional-N PLL can be used to generate the SSC signal; however, the quantization noise of the sigma-delta modulator can cause jitter on the PLL output

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fractional n-type PLL circuit
  • Fractional n-type PLL circuit
  • Fractional n-type PLL circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] Apparatuses, systems and methods for fractional frequency dividers and fractional-N phase-locked loops (PLLs) for spread spectrum clock (SSC) generators are described herein. In the following, detailed details are set forth to provide a thorough understanding of the embodiments. Those skilled in the art will recognize, however, that the techniques taught herein may be practiced without one or more of the following details, or with other methods, components, materials, etc. In other instances, known structures, materials, or operations are not shown or described in detail to avoid obscuring certain aspects.

[0019] In some embodiments of the present invention, a sigma-delta modulator-type fractional-N phase-locked loop may be used to generate a spread-spectrum clock (SSC) signal, which is used by electronic components to suppress electromagnetic interference (EMI). Quantization noise generated by the sigma-delta modulator can cause jitter to the output of the phase-loc...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A fractional-N phase locked loop (PLL) circuit (104, 600, 800) is provided. The PLL circuit (104, 600, 800) generates a spread spectrum clock (SSC) using averaging techniques to suppress phase interpolator nonlinearities. The PLL circuit (600, 800) includes a fractional frequency divider (606, 806) with hybrid finite impulse response (FIR) filtering. Furthermore, a small and low power frequency divider for a hybrid FIR fractional N-type PLL circuit (600, 800) is provided.

Description

technical field [0001] Embodiments of the present invention relate to the field of electronic circuits, in particular to a fractional frequency divider type fractional N phase locked loop for a spread spectrum clock generator. Background technique [0002] A spread spectrum clock (Spread Spectrum Clock, SSC) signal is used in electronic components to facilitate suppression of electromagnetic interference. The SSC signal is clocked with different frequencies, typically oscillating between min / max, depending on the desired modulation shape function (eg, sine wave, triangle wave, etc.). The SSC signal can be generated by modulating the frequency of a clock signal generated by a Phase Locked Loop circuit (Phase Locked Loop, PLL) according to a predetermined modulation frequency and modulation angle. A sigma-delta modulator type fractional-N PLL can be used to generate the SSC signal; however, the quantization noise of the sigma-delta modulator will cause jitter on the PLL outpu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H03L7/18G06F1/04
Inventor 罗可欣周凯曹圣国岳岭峰褚方青沈煜吴智
Owner LATTICE SEMICON CORP
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More