Coating detecting device

Abstract

The invention provides a coating detecting device and method. The coating detecting device comprises a bearing platform, a conveying wheel set, a fixing support, a plurality of CCD image sensors, a plurality of film thickness measurers and a computer for processing data. The coating detecting device has the advantages that the row of CCD image sensors are arranged above the conveying wheel set, the arranging density of the CCD image sensors is increased, a high-precision AOI detecting function is achieved, coating defects such as foreign matter, bubbles, color halo, scratches and printing skewing can be detected effectively, extra spot checking is not needed later to perform macroscopic and microcosmic detection, operators does not need to remotely sense the back and forth movement of the CCD image sensors, the coating effect of a substrate can be detected in a full-automatic manner, productivity can be increased effectively, a film thickness measuring function is achieved by the film thickness measurers, and comprehensive detecting of the coating effect of the substrate is achieved.

Description

technical field [0001] The invention relates to the field of display panel manufacture, in particular to a coating detection device. Background technique [0002] A liquid crystal display (Liquid Crystal Display, LCD) has many advantages such as a thin body, power saving, and no radiation, and has been widely used. Most of the liquid crystal display devices currently on the market are backlight type liquid crystal display devices, which include a liquid crystal display panel and a backlight module. Usually, a liquid crystal display panel consists of a color filter (Color Filter, CF) substrate, a thin film transistor (Thin Film Transistor, TFT) substrate, a liquid crystal (Liquid Crystal, LC) sandwiched between the color filter substrate and the TFT substrate, and a sealant (Sealant) composition. The working principle of the liquid crystal display panel is to place liquid crystal molecules between two parallel glass substrates, and control the liquid crystal molecules to ch...

AI Technical Summary

Problems solved by technology

However, limited by the detection accuracy of the existing automatic optical inspection device, it is impossible to realize in-line automatic inspection. During the inspection process, the operator needs to remotely sense the CCD image sensor to move back and forth above the inspected substrate to measure the substrate to be inspected. The substrates are fully inspected, and in order to avoid missed inspections, usually after AOI inspections are performed on the substrates on the line one by one, 9%-10% of the substrates need to be randomly inspected for macro inspection (MAC). The macro inspection time of each substrate is about 300s, after that, 9%-10% of the substrates need to be sampled for microscopic inspection (MIC). The microscopic inspection time of each substrate is also about 300s, and the production capacity is low.

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