Test circuit for measuring relay contact ultralow impedance

A relay contact and test circuit technology, applied in the field of electronics, can solve the problems of small resistance, expensive resistance measurement, and inability to measure, and achieve the effect of reducing costs, saving time and manpower, and avoiding geographical restrictions

Inactive Publication Date: 2017-05-10
青岛时创智能技术有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the resistance of some highly conductive materials is very small, and it cannot be measured with general laboratory instruments in many cases, and the resistance measurement price on the market is very expensive.

Method used

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  • Test circuit for measuring relay contact ultralow impedance
  • Test circuit for measuring relay contact ultralow impedance
  • Test circuit for measuring relay contact ultralow impedance

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Embodiment Construction

[0020] In order to make the purpose, technical solutions and beneficial effects of the present invention more clear, the preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so as to facilitate the understanding of technical personnel.

[0021] Such as Figure 1-3 As shown, the present invention discloses a test circuit for measuring the ultra-low impedance of relay contacts. Point N3, wire LI4, wire LII5, wire LIII6, wire LIV7, precision constant current source 8, amplification module 9, signal processing module 10, A / D conversion module 11, MCU control module 12, display module 13; One end of the measured resistance 1 is provided with a connection point of the measured resistance M2, and the connection point of the measured resistance M2 is connected with a wire LI4 and a wire LII5. Connected with wire LIII6 and wire LIV7; the precision constant current source 8 is connected to the measured resistanc...

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Abstract

The invention relates to a test circuit for measuring relay contact ultralow impedance, and belongs to the technical field of electronics. A measuring system based on an R5F212A7 single-chip microcomputer includes a measured resistor, a precise constant current source, an amplifier module, a signal processing module, an A / D conversion module, an MCU control module and a display module; the precise constant current source is connected with the measured resistor, a measured resistor connection point M and a measured resistor connection point N are connected with the amplifier module at the same time, the amplifier module is connected with the signal processing module having a signal processing function, the signal processing module is connected with the A / D conversion module, the A / D conversion module is connected with the MCU control module, and the MCU control module is connected with the display module. The intelligent microresistivity measuring system adopts the microprocessor R5F212A7, realizes measurement of the electrical resistivity of some high-conductivity material, avoids the geographic restrictions to which measurement in a laboratory must be subjected, also avoids purchase of an expensive microresistivity measuring instrument, saves both time and manpower and reduces cost.

Description

technical field [0001] The invention belongs to the technical field of electronics, and in particular relates to a test circuit for measuring ultra-low impedance of relay contacts. Background technique [0002] In engineering practice, it is often necessary to measure the resistivity of some highly conductive materials. In scientific research, resistivity is often used as a means to detect changes in the structure and form of materials. However, the resistance of some highly conductive materials is so small that it cannot be measured with general laboratory instruments in many cases, and the resistance measurement price on the market is very expensive. [0003] Therefore, it is necessary to propose a low-cost, high-quality, economical and applicable resistivity measurement device. Contents of the invention [0004] In order to overcome the problems existing in the background technology, the present invention provides a test circuit for measuring the ultra-low impedance o...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/02
CPCG01R27/02
Inventor 徐月文
Owner 青岛时创智能技术有限公司
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