A digital integrated circuit standard sample

Abstract

The invention discloses a digital integrated circuit standard sample, which includes a signal conversion circuit, an analog-to-digital conversion circuit, and an MCU connected in sequence. The input end of the signal conversion circuit is connected to the voltage or current signal end of the integrated circuit test system, and the input end of the MCU is connected to the signal end of the integrated circuit test system. It is connected with the output end of the integrated circuit test system and the traceability module, and the output end of the MCU is connected with the control input end of the signal conversion circuit; the input end of the traceability module is connected with the voltage or current signal end; wherein the MCU is input according to the integrated circuit test system The mode control signal controls the operation mode and measurement mode type of the standard sample, and is also used to measure and calibrate the voltage or current. It can be directly used for on-line measurement and calibration of applying voltage to measure voltage, applying voltage to measure current, applying current to measure current, and applying current to measure voltage in an integrated circuit test system, and display the measurement results in real time. At the same time, it has a traceability function, which can ensure the accuracy of the calibration results.

Description

Technical field [0001] The invention relates to the technical field of microelectronics measurement, in particular to a digital integrated circuit standard sample used for online calibration of an integrated circuit test system. Background technique [0002] The methods and ways of traceability and transmission of microelectronic quantities have always been the key to hindering the development of microelectronics measurement verification, calibration and comparison. The standard sample is a good way to realize the traceability and transmission of the value. It has many advantages such as convenient carrying, simple calibration process, and on-site calibration. There are two main types of standard samples currently used in the field of microelectronics measurement. One is to inspect the repeatability and stability of standard samples through a series of screening and periodic inspections, and select integrated circuits whose values ​​meet certain uncertainty requirements from exi...

AI Technical Summary

Problems solved by technology

These two kinds of standard samples need to be fixed before use, and the fixed value takes a long period, and the parameter range without fixed value cannot be used for calibration, which lacks flexibility, so it is used in the test system has certain limitations when calibrating the full scale of the

At the same time, because the circuit used for the calibration of the standard sample is not exactly the same as the circuit used for the calibration of the test system, it will cause certain errors during calibration

In addition, there is currently a lack of standard samples for online calibration of digital integrated circuit test systems, so it is very necessary to develop such standard samples

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