Overtemperature protection circuit and driving method

Abstract

Embodiments of the invention disclose an overtemperature protection circuit and a driving method. The overtemperature protection circuit comprises a constant current source circuit, a comparator circuit and an output circuit, wherein the comparator circuit comprises a negative temperature coefficient resistor, a first resistor and a voltage comparator; the comparator circuit compares a first voltage end at the first input end and a second voltage value at the second input end, and outputs a control signal according to a comparison result, wherein when the temperature is greater than or equal to a protection threshold value, the control signal is an overtemperature control signal; and the output circuit is used for outputting a switch-off enabling signal when the comparator circuit outputs the overtemperature control signal. By virtue of the scheme provided by the embodiment, a device can be switched off in time at an overhigh temperature so as to protect the device.

Description

Technical field [0001] The invention relates to electronic circuit technology, in particular to an over-temperature protection circuit and a driving method. Background technique [0002] In view of the continuous integration of existing integrated circuit functions, the increase in circuit scale, the temperature rise caused by power consumption and the increase in ambient temperature will affect the stability of circuit performance. In addition, for the existing integrated circuit chip IC, the internal Devices with integrated over-temperature protection (OTP) functions are mostly active devices, such as Power IC RT8510. For passive chips, there is no integrated OTP protection circuit. If such devices work for a long time, the temperature rise due to power consumption and ambient temperature The increase of, will cause adverse effects such as temperature drift in the working voltage of the device, causing the passive device to work in an abnormal state, and even the device is burn...

AI Technical Summary

Problems solved by technology

[0002] For the continuous integration of functions of existing integrated circuits, the increase of circuit scale, the temperature rise caused by power consumption and the increase of ambient temperature will have an impact on the stability of circuit performance. In addition, for the existing integrated circuit chip IC, the internal Devices with integrated over-temperature protection (OTP) function are mostly active devices, such as Power IC RT8510, for passive chips, there is no integrated OTP protection circuit inside, and if such devices work for a long time, due to power consumption temperature rise and ambient temperature The increase of the temperature will cause adverse effects such as temperature drift of the working voltage of the device, causing the passive device to work in an abnormal state, or even burn the device

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