A kind of over-temperature protection circuit and driving method

Abstract

The embodiment of the invention discloses an over-temperature protection circuit and a driving method. The circuit includes: a constant current source circuit, a comparator circuit and an output circuit, the comparator circuit includes a negative temperature coefficient resistor, a first resistor and a voltage comparator, and the comparator circuit compares the first input terminal A voltage and the value of the second voltage at the second input terminal, and output a control signal according to the comparison result, wherein the control signal is an over-temperature control signal when the temperature is greater than or equal to the protection threshold; the output circuit is used for the When the comparator circuit outputs the over-temperature control signal, it outputs a shutdown enable signal. The solution provided by the embodiment of the present invention can shut down the device in time to protect the device when the temperature is too high.

Description

technical field [0001] The invention relates to electronic circuit technology, in particular to an over-temperature protection circuit and a driving method. Background technique [0002] For the continuous integration of functions of existing integrated circuits, the increase of circuit scale, the temperature rise caused by power consumption and the increase of ambient temperature will have an impact on the stability of circuit performance. In addition, for the existing integrated circuit chip IC, the internal Devices with integrated over-temperature protection (OTP) function are mostly active devices, such as Power IC RT8510. For passive chips, there is no integrated OTP protection circuit inside. If such devices work for a long time, due to power consumption temperature rise and ambient temperature The increase of the temperature will cause adverse effects such as temperature drift of the working voltage of the device, causing the passive device to work in an abnormal stat...

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Problems solved by technology

[0002] For the continuous integration of functions of existing integrated circuits, the increase of circuit scale, the temperature rise caused by power consumption and the increase of ambient temperature will have an impact on the stability of circuit performance. In addition, for the existing integrated circuit chip IC, the internal Devices with integrated over-temperature protection (OTP) function are mostly active devices, such as Power IC RT8510, for passive chips, there is no integrated OTP protection circuit inside, and if such devices work for a long time, due to power consumption temperature rise and ambient temperature The increase of the temperature will cause adverse effects such as temperature drift of the working voltage of the device, causing the passive device to work in an abnormal state, or even burn the device

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