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Material biaxial compression loading device for environment scanning electron microscope

An environmental scanning electron microscope and loading device technology, applied in the field of materials science, can solve the problems of lack of meso-scale experimental devices, strict requirements for observation conditions, and inability to observe changes in the microstructure of materials.

Pending Publication Date: 2017-07-21
CHINA UNIV OF PETROLEUM (BEIJING)
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the mechanical properties of materials are greatly affected by the ambient temperature and humidity, so the mechanical characterization test of materials generally requires the application of coupling fields; however, conventional coupling field test devices generally only correspond to the macro scale, and cannot observe the microscopic structural changes
In addition, the existing means of observing the microstructure of materials such as optical microscopes, scanning electron microscopes, and CT generally have strict requirements on observation conditions, and it is difficult to realize the loading of coupling fields.
[0003] To sum up, it is very critical and necessary to consider the change of microstructure in the test of mechanical properties of materials. The scale experiment device is very lacking, it is urgent to invent a new loading device to solve this problem

Method used

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  • Material biaxial compression loading device for environment scanning electron microscope
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  • Material biaxial compression loading device for environment scanning electron microscope

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Embodiment Construction

[0037] For this reason, the present invention proposes a material biaxial compression loading device for environmental scanning electron microscope, which includes: a biaxial mechanical loading host, which consists of a front side wall, a rear side wall, a left side wall, a right side The base is surrounded by a wall and a base, and a cooling platform is provided in the middle of the base for placing test pieces; two bases are installed horizontally on the left side wall and the rear side wall respectively, and the base A fixed pressure head is connected to the inner end of the seat; two servo motors control the loading system, and the servo motor control system includes a bearing, a ball screw, a reducer and a drive unit that drives the reducer to work. The inner end of the ball screw is connected with the outer end of the bearing, the outer end is connected with the output end of the reducer, the inner end of the bearing is connected with the outer end of a force sensor, and ...

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Abstract

The invention provides a material biaxial compression loading device for an environment scanning electron microscope. The material biaxial compression loading device comprises a biaxial mechanical loading main machine, two bases and two servo motor control loading systems, wherein the biaxial mechanical loading main machine is formed by enclosing a front side wall, a rear side wall, a left side wall, a right side wall and a seat; a cooling table is arranged at the center of the base for a test piece to be placed on; the two bases are respectively and horizontally mounted on the left side wall and the right side wall, and a fixed pressure head is connected to the inner end of each of the bases; each of the servo motor control loading systems comprises a bearing, a ball screw, a speed reducer and a drive unit for driving the speed reducer to work; the inner end of the ball screw is connected with the outer end of the bearing, the outer end of the ball screw is connected with the output end of the speed reducer, the inner end of the bearing is connected with the outer end of a force sensor, a grating sensor is embedded in the ball screw, and the two ball screws are correspondingly arranged on the right side wall and the front side wall in a penetrating manner; when the test piece is placed on the cooling table, the fixed pressure head and a moving pressure head of the force sensor are correspondingly connected with the side surface of the test piece.

Description

technical field [0001] The invention belongs to the technical field of material science, and in particular relates to a material biaxial compression loading device for an environmental scanning electron microscope. Background technique [0002] In materials science, the mechanical properties of materials are critical to whether materials can serve engineering. The most common material mechanical performance indicators such as Young's modulus, Poisson's ratio, compressive strength, tensile strength, and shear strength all reflect the macroscopic mechanical properties of the material. However, in practical applications, some deformation mechanical behaviors of materials cannot be well explained by the above indicators. In addition, macro-scale studies rarely involve research on damage, and micro-cracks cannot be directly observed with the naked eye, and some studies are reflected by indirect measurement methods (acoustic emission, ultrasonic, etc.), so it is necessary to seek...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/02G01N3/18
CPCG01N3/02G01N3/18
Inventor 王琳琳任富强胡杰万斌
Owner CHINA UNIV OF PETROLEUM (BEIJING)