On-chip test system and test method for millimeter wave frequency divider

Abstract

The invention provides an on-chip test system for a millimeter wave frequency divider. The structure of the on-chip test system for a millimeter wave frequency divider includes a processor, a probe bench, a signal source, a spread spectrum module, a frequency spectrograph, a power supply, a direct current probe card, a left probe system and a right probe system. The on-chip test method for a millimeter wave frequency divider includes the steps: 1) testing the link loss during the process of connecting an output end of a frequency divider chip to the frequency spectrograph; 2) determining whether the test link is connected normally; 3) connecting a frequency divider chip to be tested, and controlling the power supply to supply power to enable the frequency divider to work normally; 4) acquiring data; 5) calculating the work frequency range and the output power of the frequency divider chip to be tested by means of the processor; and 6) determining whether or not to perform tests of other frequency divider chips. The on-chip test system for a millimeter wave frequency divider has the advantages of 1) realizing accurate testing of the work frequency range and the output power of the millimeter wave frequency division circuit; and 2) realizing the on-chip automatic test of the millimeter wave frequency divider, and improving the testing efficiency.

Description

technical field [0001] The invention relates to an on-chip testing system and testing method suitable for a millimeter-wave frequency divider. The method is suitable for related testing of the millimeter-wave frequency divider and belongs to the field of ultra-high-speed chip testing. Background technique [0002] Ultra-high-speed frequency divider is the most basic and commonly used form of digital circuits, and it is also the circuit that best reflects the level of processing technology and the speed of digital systems; frequency dividers are widely used in signal processing, phase-locked loops and frequency synthesizers. It has a wide range of applications in electronic reconnaissance, jamming, radar, missiles, and communications. [0003] With the continuous improvement of the device level, the limit operating frequency of the frequency divider has also been continuously increased, and even reached the limit frequency that the instrument can test; this also shows that th...

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Problems solved by technology

[0004] The present invention proposes an on-chip test system and test method suitable for millimeter-wave frequency dividers. accurate test

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