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Passive inter-modulation test method based on near field coupling of slot waveguide

A slot waveguide and test method technology, applied in the field of passive intermodulation test devices, can solve the problems of single control, difficulty in giving the specific source of PIM, increase the cost and design cycle of improving PIM, etc., and achieve the effect of improving product yield

Active Publication Date: 2017-07-28
XI AN JIAOTONG UNIV
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Problems solved by technology

If the influence of each physical factor on the PIM of the device cannot be controlled individually, the cost and design cycle of improving PIM will be increased
Due to the various sources of PIM, it is difficult to give the specific source of PIM in the overall inspection, and once the PIM of the product is unqualified, it cannot be reworked. Therefore, there is an urgent need for a technical method that can detect the source of PIM in raw materials and semi-finished products during the production process. So that the DUT does not need to have microwave characteristics, it only needs to exist in the form of a sample

Method used

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  • Passive inter-modulation test method based on near field coupling of slot waveguide
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  • Passive inter-modulation test method based on near field coupling of slot waveguide

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Embodiment Construction

[0022] The flange connection of the waveguide and the screw connection port of the ground wire of the base station antenna are all planar port connections of microwave devices, which can be equivalent to a flat crimping model in the study. In the experiment, the contact surface between three metal samples was used as the contact surface to be tested. The experimental sample is small, and the roughness, coating process, and contact pressure can be precisely controlled according to the research needs, and it is beneficial to the later surface morphology and composition analysis.

[0023] Taking the S-band waveguide as an example, set up a PIM test system, such as figure 1 , where the local structure of the slot waveguide is as figure 2 As shown, the dimensional characteristics of the slot waveguide are as follows:

[0024] Such as image 3 and Figure 4 As shown, the inner wall of the waveguide is 72.14mm wide and 34.04mm high; the outer wall is 76.2mm wide and 39.1mm high;...

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Abstract

The invention discloses a passive inter-modulation test method based on near field coupling of a slot waveguide. The method realizes a near-field coupling PIM (Passive Inter-Modulation) test function by adding a slot waveguide structure in a test system on the basis of a conventional PIM test methods. The passive inter-modulation test method comprises the optimization method of a low-PIM slotted waveguide, a dielectric plate for regulating the coupling strength, and the slot size and distribution. The passive inter-modulation test method based on the near field coupling of the slot waveguide provided by the invention can be used for evaluating the size of nonlinearity and contact nonlinearity of microwave component materials, provide guidance for low PIM design and process control of the microwave component, provide a detection method for PIM sources in the production link, and improve the product yield.

Description

technical field [0001] The invention relates to a passive intermodulation test device and a test method for metal connection junctions of microwave components based on slot waveguide near-field coupling, and belongs to the technical field of passive intermodulation tests. Background technique [0002] Passive Inter-Modulation (PIM for short) refers to an additional interference signal to the system caused by two or more carrier signals of different frequencies passing through nonlinear passive devices. In wireless communication systems, common nonlinear passive components include duplexers, antennas, feeders, and radio frequency connectors. If these intermodulation distortion signals fall into the receiving frequency band, and the power exceeds the minimum amplitude of the useful signal in the system, the signal-to-noise ratio of the receiving signal will decrease, the sensitivity of the receiver will decrease or even fail to work normally, and the communication system will ...

Claims

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Application Information

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IPC IPC(8): H04B3/46
CPCH04B3/46
Inventor 高凡赵小龙张松昌贺永宁
Owner XI AN JIAOTONG UNIV
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