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Three-dimensional measurement method of structured light based on segmented quantization phase encoding

A phase encoding, three-dimensional measurement technology, applied in the field of three-dimensional measurement, to achieve the effects of good robustness, improved accuracy and three-dimensional measurement accuracy, and high measurement accuracy

Active Publication Date: 2019-12-13
NANCHANG HANGKONG UNIVERSITY
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Problems solved by technology

In addition, the traditional phase encoding method only uses a 1-bit codeword to determine the fringe order

Method used

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  • Three-dimensional measurement method of structured light based on segmented quantization phase encoding
  • Three-dimensional measurement method of structured light based on segmented quantization phase encoding
  • Three-dimensional measurement method of structured light based on segmented quantization phase encoding

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Embodiment Construction

[0055] The implementation of the present invention will be described in further detail below in conjunction with the accompanying drawings, but this example is not intended to limit the present invention. All similar structures and similar changes of the present invention should be included in the protection scope of the present invention.

[0056] A structured light three-dimensional measurement method based on segmented quantization phase encoding, including the following steps: (1) Writing sinusoidal fringes

[0057] The actual measurement usually uses the four-step phase shift method for three-dimensional measurement, then the four sinusoidal fringe patterns:

[0058] A n (x,y)=A'(x,y)+A"(x,y)cos[φ 1 (x,y)+2πn / 3] (n=1,2,3,4)

[0059] Among them, A'(x,y) is the average brightness, A"(x,y) is the modulation brightness, φ 1 (x,y) is the phase to be sought. Generate A 1 、A 2 、A 3 、A 4 4 sinusoidal fringe patterns, such as figure 2 shown.

[0060] (2) Writing segment...

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Abstract

The invention discloses a structured light three-dimensional measurement method based on segmental quantization phase encoding, which is composed of two key parts: segmental quantization phase encoding principle and three-dimensional measurement principle. The advantages of the present invention are: (1) Compared with the traditional sinusoidal fringe pattern plus phase-encoded fringe pattern three-dimensional measurement method: the traditional method monotonously and limitedly quantizes the encoding phase to produce a unique codeword, and only uses a 1-bit codeword to determine the current cycle The fringe level; this method modulates the quantized coding phase through a specific coding sequence, and the specific coding rules greatly improve the accuracy of decoding; (2) This method embeds the modulated quantized coding phase into three coded fringe images , and use continuous 3-bit codewords to determine the current periodic fringe order, which greatly improves the accuracy of the fringe order and the three-dimensional measurement accuracy; (3) According to the actual measurement needs, this method can generate more codewords, and the measurement It has high precision and good robustness, and has potential application prospects and practical value in the three-dimensional measurement of complex objects, larger objects, and objects with a single color.

Description

technical field [0001] The invention relates to a three-dimensional measurement method, in particular to a three-dimensional measurement method of structured light projection with subsection quantization phase encoding. Background technique [0002] Structured light projection profilometry is of great significance in three-dimensional measurement due to the advantages of non-contact, high precision, lossless measurement in the whole field, fast measurement speed, high sensitivity and high degree of automation. 3D measurement systems such as figure 1 As shown, it includes DLP projector 1, black and white CCD camera 2, workstation 3, measurement support 4, reference plane 5 and object 6 to be measured; DLP projector 1 and black and white CCD camera 2 are placed on measurement support 4; DLP projector 1 The black and white CCD camera 2 is respectively connected to the workstation 3 through a data cable; the object to be measured 6 is placed on the reference plane 5; the workst...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 伏燕军王霖王凤丽韩旭夏桂锁方利华
Owner NANCHANG HANGKONG UNIVERSITY
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