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ISFET measuring probe, measurement circuit for the ISFET measuring probe, and method

A technology for measuring circuits and detectors, which can be used in measuring devices, instruments, scientific instruments, etc., and can solve problems such as consumer danger, mixed glass fragments, and fragility

Inactive Publication Date: 2017-09-01
METTLER TOLEDO INC
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0009] Another disadvantage that glass electrodes have is that they are very fragile
In case of breakage, glass shards will be mixed in the processed material and thus pose a danger to the consumer

Method used

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  • ISFET measuring probe, measurement circuit for the ISFET measuring probe, and method
  • ISFET measuring probe, measurement circuit for the ISFET measuring probe, and method
  • ISFET measuring probe, measurement circuit for the ISFET measuring probe, and method

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Embodiment Construction

[0046] figure 1 A measuring probe M according to the invention is shown schematically with an ISFET T arranged in a housing G, a reference electrode RE, an auxiliary electrode AUX and a measuring circuit MC according to the invention. The measurement probe M is shown in the working state when taking measurements. ISFET T, reference electrode RE and auxiliary electrode AUX are connected to measurement circuit MC and immersed in measurement solution L contained in the measurement space. The measurement circuit MC generates and processes electrical signals to determine the ion concentration of the measurement solution L and the state of the measurement probe M. The reference electrode RE has a membrane D which is used to capture the potential of the measurement solution L and whose state is monitored during the diagnostic process.

[0047] figure 2 A conventional circuit MC for measuring the concentration of ions in a measurement solution L by means of a measurement probe M c...

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Abstract

ISFET measuring probe with a housing in which an ISFET and a reference electrode are arranged in such a way that the gate electrode of the ISFET, which is coated with an ion-sensitive layer, and the reference electrode reach into a measurement space into which a measurement medium can be introduced, with the distinguishing feature that an auxiliary electrode is arranged additionally inside the housing and is held inside the measurement space.

Description

technical field [0001] The present invention relates to an ISFET (Ion Sensitive Field Effect Transistor: Ion Sensitive Field Effect Transistor) measuring probe, a measuring circuit for an ISFET measuring probe, and a method by which the pH measuring probe can be determined The state of the diaphragm of the reference electrode. Background technique [0002] In research laboratories and in various fields of industry such as chemistry, food, biotechnology or pharmaceuticals, measuring electrodes or measuring probes are used to determine the pH value in the measuring medium. The pH value of the measuring medium indicates the state, taste or quality of the measuring medium. In chemical processes, pH is also used to control manufacturing processes. [0003] The pH measurement is performed on the principle of potentiometric measurement. In potentiometric measurements, the measuring electrode (ISFET) and reference electrode are immersed in the measuring medium. Via the reference...

Claims

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Application Information

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IPC IPC(8): G01N27/414
CPCG01N27/414G01N27/4167G01N27/302G01N31/221G01N27/4148G01N27/4165
Inventor I·A·沙伊德尔P·霍恩
Owner METTLER TOLEDO INC
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