Detection device and method for judging and recording position of silicon wafers
A detection device and silicon chip technology, applied in the direction of measuring devices, optical devices, instruments, etc., to achieve the effects of quality assurance, reduced calibration time, and short action time
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[0024] The present invention will be further described below in conjunction with accompanying drawing:
[0025] figure 1 Schematic diagram of the detection device for identifying and recording the silicon wafer position. The device consists of two parts: a mechanical structure module and a signal acquisition module. The mechanical structure module includes a silicon chip (1), a silicon chip box (2), a vertical support (3), a horizontal support (9), a cylinder body (4), a cylinder piston (5), a horizontal guide rail (8), and a sensor Connecting plate (12) and slider beam (6). The signal acquisition module includes an infrared distance sensor (7), an acquisition card (10) and an industrial computer (11).
[0026] The silicon wafer (1) is placed in the silicon wafer box (2) according to the slot position, the silicon wafer box (2) and the vertical support (3) are on the same working plane, and the vertical support (3) is installed on the working plane by bolts Above, the hori...
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