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Method for observing track topography of solid nuclear track detector by means of optical microscope

A technology of optical microscope and solid nuclear track, which is applied in the direction of scientific instruments, instruments, measuring devices, etc., can solve the problems of expensive, unsuitable, and long-time instruments, and achieve the effect of shortening working time and improving work efficiency

Active Publication Date: 2017-09-08
THE BEIJING PREVENTION & TREATMENT HOSPITAL OF OCCUPATIONAL DISEASE FOR CHEM IND
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these instruments are expensive and only a few laboratories can equip them
In addition, since the CR39 detector is non-conductive, electron microscope observation must have a complicated coating process and must be observed in a vacuum, which leads to the fact that the detector cannot continue to be etched after observation, and is not suitable for observing the changing state of the track after continuous etching ; AFM is generally suitable for analyzing small tracks etched in a short time, and it takes a long time to scan a whole detector (Huang Sanbo, Wei Zhiyong, etc., CR-39 Solid Nuclear Track Detector Observation Method, Nuclear Electronics and Detection Technology, 2011, 31(9):1008-1013)

Method used

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  • Method for observing track topography of solid nuclear track detector by means of optical microscope
  • Method for observing track topography of solid nuclear track detector by means of optical microscope
  • Method for observing track topography of solid nuclear track detector by means of optical microscope

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Effect test

Embodiment 1

[0054] Prepare the CR39 detector into a square detector, use plastic grinding stones and plastic grinding powder to grind and polish the four sides of the square detector, and mark the observation side.

[0055] The CR39 detector was irradiated by the HI-13 tandem accelerator-single event effect heavy ion irradiation device of China Institute of Atomic Energy, and the ion energy was 210MeV. 72 Ge is vertically incident on the CR39 detector, and the observation edge is guaranteed to be in the beam field, and the fluence reaches 5×10 4 / cm 2 .

[0056] Configure 6mol / L NaOH aqueous solution as the etching solution, the etching temperature is 50°C, put the CR39 detector into the etching solution for etching for a certain period of time (530, 1560, 2000, 3440min), use tweezers (not touching the observation side) from the etching solution Take out the CR39 detector, soak it in dilute hydrochloric acid for 10 minutes, then wash it twice in deionized water, and finally blow dry it ...

Embodiment 2

[0060] Prepare the CR39 detector into a square detector, use plastic grinding stones and plastic grinding powder to grind and polish the four sides of the square detector, and mark the observation side.

[0061] The CR39 detector was irradiated by the HI-13 tandem accelerator-single event effect heavy ion irradiation device of China Institute of Atomic Energy, and the ion energy was 272.14MeV. 126 I vertical incidence CR39 detector, and ensure that the observation edge is in the beam field, the fluence reaches 924 / cm 2 .

[0062] Configure 6mol / L NaOH aqueous solution as the etching solution, the etching temperature is 50°C, put the CR39 detector into the etching solution for a certain period of time (560min), and take out the CR39 detector from the etching solution with tweezers (not touching the observation side) , soaked in dilute hydrochloric acid for 10 minutes, then washed twice in deionized water, and finally dried with ear wash balls.

[0063] Stand the CR39 detector...

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Abstract

The invention discloses a method for observing track topology of a solid nuclear track detector by means of an optical microscope. The method comprises the following steps of preparing the solid nuclear track detector which is a square detector, rubbing and polishing four sides of the square detector, and identifying an observing side; performing vertical irradiation on the square detector by means of particle beam flow for forming the detector after irradiation, wherein the irradiation area of the particle beam flow is larger than the area of the square detector; etching the irradiated detector, thereby forming the etched detector, then taking the etched detector out, and obtaining a to-be-observed detector through post-treatment; wherein no contact between the observing side and a hard object is ensured in a taking-out process; and placing the to-be-observed detector on an observing platform of the optical microscope, and making the observing side face an objective lens of the optical microscope, thereby observing the track topography. The method realizes a purpose of observing the track topography by means of the optical microscope.

Description

technical field [0001] The invention relates to a method for observing the track shape of a solid nuclear track detector, in particular to a method for observing the track shape of a solid nuclear track detector with an optical microscope. Background technique [0002] Solid state nuclear track detector is an important detector. When charged particles enter the solid nuclear track detector material, radiation damage is caused around the trajectory along its range, forming nano-scale sneak tracks; these sneak tracks are chemically etched, and the ratio of the damaged area to the undamaged area is used The principle of being easily corroded makes the submerged tracks in the detector material amplified in order to record the number of tracks. [0003] Solid state nuclear track detectors have broad application prospects in radiation research and radiation protection dosimetry. Taking CR39 detector as an example, CR39 detector is widely used in space heavy particle radiation mo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T5/00
CPCG01T5/006
Inventor 张贵英惠宁沈东军郭泽钦王志超丁晓文曹磊王小春牛东升李珏
Owner THE BEIJING PREVENTION & TREATMENT HOSPITAL OF OCCUPATIONAL DISEASE FOR CHEM IND
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