Method and system for detecting device fault

Abstract

The invention discloses a method and a system for detecting a device fault. The method includes: 1, acquiring model parameters and a rule base, wherein the model parameters include a device type, a device structure, the number of measuring points, the distribution of the measuring points and the attributes of the measuring points, and the rule base includes fault types, corresponding fault characteristic parameters and set thresholds; 2, constructing the fault models of a device according to the model parameters and the rule base, wherein every device type corresponds to multiple fault types, and every fault model comprises the fault characteristic parameters, the set thresholds of the fault characteristic parameters, and the corresponding fault types; 3, acquiring the infrared thermogram of every measuring point of the device; 4, extracting the device characteristic parameters from the infrared thermogram according to the model parameters; and 5, acquiring the fault detection result of the device according to the fault models and the device characteristic parameters, wherein the fault detection result comprises the fault location and the fault severity level. The method and the system have the advantages of realization of the analysis of the running state of the device, realization of online detection, and improvement of the detection accuracy of the device faults.

Description

technical field [0001] The invention relates to the field of intelligent detection, in particular to a device fault detection method and system. Background technique [0002] In the field of equipment status detection, infrared detection technology is a kind of equipment fault detection technology, especially for electrical equipment types, infrared detection technology is usually used for fault detection. When the components of the operating equipment suffer from wear, fatigue, exception, deformation, corrosion, loosening, melting, material deterioration, and abnormal vibration, there will be direct or indirect temperature changes, and the overall or partial thermal balance of the equipment will also be damaged or affected. , Through heat transfer, the heat inside the device must be gradually transferred to the outside of the device, resulting in changes in the temperature field on the outside, which can be detected with an infrared thermal imager. [0003] Thermal imaging...

AI Technical Summary

Problems solved by technology

Therefore, the existing equipment fault detection method usually analyzes the thermal image in the later stage, and then judges the fault condition of the equipment, which has a certain delay and requires certain experience requirements for analysts, resulting in low accuracy of equipment fault detection

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