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Two-dimensional outline layout method based on variable angle chain code

An angle chain code, two-dimensional contour technology, applied in the field of two-dimensional contour layout based on variable angle chain code, to overcome the low filling rate of layout, improve layout efficiency, improve filling rate and layout The effect of efficiency

Active Publication Date: 2020-02-04
YANSHAN UNIV
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the deficiencies of the existing nesting methods and further improve the nesting quality

Method used

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  • Two-dimensional outline layout method based on variable angle chain code
  • Two-dimensional outline layout method based on variable angle chain code
  • Two-dimensional outline layout method based on variable angle chain code

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Embodiment Construction

[0055] The present invention will be further described below in conjunction with specific examples.

[0056] A two-dimensional contour layout method based on variable angle chain codes of the present invention is suitable for layout of polygonal and special-shaped parts, whether it is for leather, clothing material cutting, or stamping parts. Its flow chart is as Figure 4 As shown, the specific implementation steps of the method are as follows:

[0057] Step 1 extracts the Beamlet curve of the layout boundary of the parent metal and the Beamlet curve of the outline to be nested;

[0058] According to the principle of the most left and the bottom, use the Beamlet transformation method to extract the curve in the image from the boundary of the parent material, and the curve obtained by this method is called the Beamlet curve; similarly, the contour to be nested is transformed by the Beamlet The method extracts the curve in the image; thereby obtaining the Beamlet curve of the...

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Abstract

A two-dimensional contour nesting method based on variable angle chain codes, the content of which is: extract the border of the nest and the Beamlet curve of the contour to be nested, divide them according to the segmentation level parameters, connect the division points to generate a curve, and carry out Determine the concave and convex feature points, generate concave and convex intervals; use the interval endpoints to re-extract the Beamlet curve, and combine the Beamlet curve of the concave / convex interval of the base material with the convex interval / convex interval to be matched with it The Beamlet curve of the concave interval is divided according to the same segmentation layer parameters, and the angle chain code between the concave interval of the base material and all the convex intervals to be laid out and the angle chain between the convex interval of the base material and all the concave intervals to be laid out are generated code; use the obtained angle, the length of the angle chain and the area formed by connecting the interval endpoints, use the weighted sum of the three difference degrees to calculate the difference degree, select the interval with the smallest difference degree for matching, and complete the docking.

Description

technical field [0001] The invention relates to an outline layout method, in particular to a two-dimensional outline layout method based on variable angle chain codes. Background technique [0002] The nesting problem is common in the manufacturing industry. Solving this problem can improve the utilization rate of materials, thereby reducing the production cost of enterprises and improving the competitiveness of enterprises. Therefore, research on layout problems has important application value. [0003] The two-dimensional layout problem is the most widely studied layout problem. The common two-dimensional contour layout methods are mainly divided into three categories: NFP-based layout methods, envelope polygon-based layout methods, and discrete layout methods. Nesting method. Nesting methods based on critical polygons can better solve the layout problem, but this type of method is limited by the calculation of critical polygons. Existing critical polygons have difficulti...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06K9/46G06Q10/04G06Q50/04
CPCG06Q10/043G06Q50/04G06V10/44Y02P90/30
Inventor 郭保苏高志陈建超李永欣吴凤和
Owner YANSHAN UNIV