Horizontal-type test apparatus and test method for measuring torsion property of material under electron microscope

Abstract

The invention provides a horizontal-type test apparatus and test method for measuring a torsion property of a material under an electron microscope. The horizontal-type test apparatus comprises a framework, a first clamping part, a second clamping part, a control apparatus and an electron microscope; the first clamping part is installed on the framework and comprises a fixed clamp for clamping a test sample in a rotating manner; the second clamping part is installed on the framework and is oppositely and horizontally separated from the first clamping part and comprises an electromagnetic driving apparatus, a movable clamp for clamping the test sample, and an angle measuring apparatus; the control apparatus is used for setting a test method and controlling an experimental process; and the electron microscope is used for in-situ observing the variation of a test sample in the experimental process. By adopting the horizontal-type test apparatus and test method, the problem of an additional torque caused by the mass eccentricity of a rotating part after the test sample is horizontally arranged can be solved, and the apparatus can work horizontally, so that the electron microscope can realize the in-situ observation. By adopting two rotatable clamping ends, a large-angle multi-circle loading experiment of the test sample can be realized.

Description

technical field [0001] The invention relates to the field of material performance measurement, in particular to a horizontal testing device and a testing method thereof used under a scanning electron microscope (SEM) for testing torsional mechanical properties of microscale materials. Background technique [0002] At present, the torsional mechanical performance testing technology of micro-scale materials is extremely scarce in the world, the main reason is that 10 -3 It is extremely difficult to measure tiny torque below Nm. [0003] Existing measuring devices for this aspect are generally tested in a vertical state. This posture will affect the optical path of the SEM, and the magnetic flux leakage of the electromagnetic coil of the driving device in the measuring device will also affect the SEM imaging. Therefore, the existing The measuring device cannot cooperate with the SEM to perform in-situ torsion experiments on materials such as filaments. [0004] In addition, i...

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Problems solved by technology

[0005] In order to solve the problem that in-situ torsion experiments cannot be performed on micro-scale materials in the prior art, the present invention provides a horizontal testing device for testing torsional mechanical properties of micro-scale materials and its testing method

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