Single particle test system suitable for processor-like devices

Abstract

The invention relates to a single particle test system suitable for processor-like devices, which mainly comprises a tested circuit test board, system power supply, remote control, test software and monitoring software. A method for implementing the system of the invention solves the problems of poor reliability, low power supply performance, difficult operation of the test layout, low efficiency, repeated design of the monitoring software and the like of a traditional single particle test board, the reusability of the test system can be ensured, the development cost and cycle of the test system is also greatly reduced, the operability of the test layout is enhanced, the test efficiency is improved, the test preparation time is shortened, and the valuable single-particle test machine time is utilized to the full extent.

Description

technical field [0001] The invention relates to the field of radiation resistance test of integrated circuits, in particular to a single particle test system suitable for processor devices. Background technique [0002] The single-event test is a test that simulates the space radiation environment for integrated circuits with anti-single event effect indicators in domestic test sites that can provide particle sources, in order to complete the assessment of integrated circuit anti-radiation indicators or the evaluation of anti-radiation capabilities. In the research and development of integrated circuits for space applications, it plays a role in evaluating the anti-radiation indicators of circuits or making a thorough investigation of the anti-radiation capabilities of integrated circuits. However, the existing single particle test system generally directly realizes the interconnection between the laboratory and the monitoring room through multiple long lines, so as to compl...

AI Technical Summary

Problems solved by technology

like figure 1 As shown, firstly, at least one test board is produced for each test circuit, and different auxiliary test circuits are selected on the test board according to the characteristics of the test circuit, and the test circuit and the rest are powered separately. 1. The single particle test of multiple devices is independent, and the structure is not uniform, so it is impossible to plan and coordinate, which reduces the test efficiency; secondly, the power supply interface is connected to the power supply of the monitoring room through long-distance cables to realize communication during the test. Power-off control and real-time monitoring, this connection method of long-distance transmission of multiple cables seriously affects the performance of power supply, and the voltage drop caused by long-distance transmission is obvious, which reduces the reliability of the single particle test system; again, the test The communication interface of the board is connected to the control computer in the monitoring room through a long cable, and a large number of communication cables need to be placed next to the computer. When changing different test participants, it is necessary to switch manually in the control room, which is not safe and easy to confuse, reducing The operability of the test is improved; finally, the existing single particle test system develops the corresponding test program and monitoring program according to each test device, and other devices cannot be reused, resulting in waste of repeated development, and because of The lack of versatility leads to low maturity of the software, which affects the reliability and perfection of the software

Limited by the length and quantity of cables, the weight of the cables in the existing single particle test system is huge, the test layout and wiring are difficult, and the volume is considerable. In addition to being inconvenient to carry, when multiple cables pass through the shielded door, it will cause the shielded door It cannot be completely closed, which increases the risk of particle radiation in the test, and the cable is easy to break after being transported and folded for a long time, which increases the difficulty of troubleshooting test problems

Images