A Noise Figure Sweeping Measurement Method

A technology of noise figure and measurement method, which is applied in the field of noise figure scanning measurement, can solve the problems of reducing measurement efficiency, affecting debugging efficiency, point frequency measurement technology not suitable for low-noise receivers, fast locking, etc., to improve measurement speed and improve The effect of measuring efficiency

Active Publication Date: 2020-09-18
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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Problems solved by technology

[0003] The main disadvantage of the existing noise figure measurement scheme is that the measurement speed is slow. At each measurement frequency point, the noise figure analyzer must repeatedly perform noise source on and off control, local oscillator preset and point frequency phase-locking, and channel setting. And a series of operation processes such as waiting for the channel response to stabilize, greatly reducing the measurement efficiency
During the debugging and testing process of low-noise device components, components and modules, this measurement scheme cannot reflect the influence of the debugging state on the noise figure of the whole part in real time, and it is even difficult to find the best noise working state, which greatly affects the debugging efficiency. It is conducive to the promotion and application of noise figure analyzers in the mass production and debugging of low-noise device components, components and modules
[0004] The existing technical solution has been applied on the practical prototype as early as the middle of the last century. This technical solution is compatible with the low-noise receiver stability, hardware response speed and A / D conversion speed at that time, and can minimize the The measurement error introduced by the drift of the low-noise receiver is reduced; the disadvantage is that the measurement speed is slow, and it takes about 2.5 minutes to measure the noise figure of 401 frequency points in the microwave frequency band
[0005] With the continuous improvement of technologies such as low-noise receivers, fast phase-locking, YTO and YTF synchronous tracking, and data processing, the fastest scanning speed of noise receivers has been raised to the order of 1GHz / ms, and the retrace time has been shortened to 10ms level; the YIG filter tuning rate has reached the order of 400MHz / ms; the data processing speed has been greatly improved, and the statistical calculation rate of noise power has reached the order of 50ms / point. The existing point frequency measurement technology is no longer suitable for low-noise receivers and fast phase-locking , YTO and YTF synchronous tracking and data processing and other technologies have become restrictive factors affecting the speed of noise figure measurement

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Embodiment Construction

[0048] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0049] The noise figure scanning measurement method of the present invention is based on a hardware platform composed of a noise figure analyzer and a noise source. The noise figure analyzer realizes accurate measurement of extremely low noise signal power; Standard and stable noise power output, used as a standard excitation source for noise figure measurement.

[0050] Noise sources have a precisely scaled Excess Noise Ratio, defined as:

[0051]

[0052...

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Abstract

The present invention proposes a noise figure scanning measurement method. First, the noise figure analyzer controls the noise source to complete a scan measurement, and obtains a set of cold noise power values ​​P corresponding to the scanning frequency points cold ; Then, the noise figure analyzer controls the noise source to complete a scan measurement, and obtains a set of thermal noise power values ​​P corresponding to the scan frequency points hot ;Finally, calculate and display the Y factor, equivalent noise temperature and noise figure according to the cold and hot noise power value of the corresponding frequency point. The noise figure measurement method of the present invention realizes the continuous scanning measurement of the noise figure, significantly improves the measurement speed of the noise figure, and can accurately measure the noise figure of the tested part in real time, eliminating the need for the existing Y factor method at each measurement frequency point Operations such as turning on and off the noise source, channel preset, and waiting for a response must be repeated to improve the measurement efficiency of the noise figure.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a noise figure scanning measurement method. Background technique [0002] Noise figure is one of the key parameters characterizing the ability of the receiver and its components to handle weak signals in the presence of thermal noise. It determines the sensitivity of the receiver and affects the signal-to-noise ratio of analog communication systems and digital communication systems. BER. Accurate noise figure measurement can not only speed up the design and verification speed of low-noise receivers and related components, but also directly determine the product development cycle and the success or failure of the final application. [0003] The main disadvantage of the existing noise figure measurement scheme is that the measurement speed is slow. At each measurement frequency point, the noise figure analyzer must repeatedly perform noise source on and off control, local oscillat...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/29H04B17/336H04B17/345H04B17/00
CPCH04B17/0085H04B17/29H04B17/336H04B17/345
Inventor 宋青娥许建华梁胜利李文军郑利颖魏连成
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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