A method and system for dual-energy X-ray CT

An X-ray and CT scanning technology, applied in the field of radiation imaging, can solve problems such as difficult to ignore and errors, and achieve the effect of eliminating errors and improving the accuracy of material identification

Active Publication Date: 2017-11-17
TSINGHUA UNIV +1
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Problems solved by technology

But in fact, because dual-energy CT only collects projection data of high and low energies, theoretically, it can only use the mathematical model of two effects to decompose materials, while ignoring the influence of other effects, such as only considering the photoelectric effect and Compton scattering, while only Compton scattering and electron pair effects are considered in high-energy imaging. Although these approximations enable dual-energy CT imaging to perform material decomposition, they will inevitably bring certain errors, and in some cases these error becomes difficult to ignore

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[0023]Specific embodiments of the present invention will be described in detail below, and it should be noted that the embodiments described here are only for illustration, not for limiting the present invention. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. It will be apparent, however, to one of ordinary skill in the art that these specific details need not be employed to practice the present invention. In other instances, well-known circuits, materials or methods have not been described in detail in order to avoid obscuring the present invention.

[0024] Throughout this specification, reference to "one embodiment," "an embodiment," "an example," or "example" means that a particular feature, structure, or characteristic described in connection with the embodiment or example is included in the present invention. In at least one embodiment. Thus, appearances of the phrases "in one...

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Abstract

A method and system for dual-energy X-ray CT are disclosed. In the method, two effects which are predominant, such as the Compton effect and the pair effect, are maintained, and influences of other effects such as the photoelectric effect are eliminated, thus increasing the material decomposition precision. The method and the system are advantageous in that errors caused by direct selection of two effect equations for atomic number Z calculation in material decomposition processes in present dual-energy CT (regardless of keV low energy or MeV high energy) methods can be effectively eliminated, thus greatly improving material decomposition and recognition accuracy of dual-energy CT; and the method and the system are of great significance for applications in clinical medicine, safety inspection, industrial nondestructive testing, and other fields.

Description

technical field [0001] Embodiments of the present invention relate to radiation imaging, and in particular to a material decomposition method for dual-energy X-ray CT (Computerized Tomography) and a corresponding system. Background technique [0002] Although X-ray CT imaging technology has been widely used in the fields of clinical medicine, security inspection and industrial non-destructive testing, the current mainstream CT technology uses a single X-ray energy spectrum, uses an energy-integrating detector, and uses CT reconstruction methods to obtain The linear attenuation coefficient distribution image inside the scanned object is a grayscale image of the X-ray absorption strength of the substance, which cannot meet the needs of accurate identification of substances pursued by clinical medicine and security inspection. The emergence of X-ray dual-energy CT technology provides a powerful way to achieve accurate material identification. Dual-energy CT collects projection ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/04
CPCG01N23/04G01N23/046G01N2223/419G01N2223/423G01N2223/206A61B6/032G01N23/087
Inventor 李亮陈志强康克军张丽赵自然邢宇翔李荐民李玉兰赵眺
Owner TSINGHUA UNIV
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