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Semiconductor device and method of manufacturing same

A manufacturing method and semiconductor technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve problems such as the reduction of device radio frequency characteristics, and achieve the effect of improving radio frequency performance

Active Publication Date: 2017-11-21
SEMICON MFG INT (SHANGHAI) CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Among them, the bulk silicon CMOS process has a lower cost than the SOI CMOS process. However, in the traditional bulk silicon CMOS process, the radio frequency characteristics of the device are greatly reduced due to the influence of the substrate.

Method used

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  • Semiconductor device and method of manufacturing same
  • Semiconductor device and method of manufacturing same
  • Semiconductor device and method of manufacturing same

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Embodiment 1

[0044] Below, refer to Figure 1A to Figure 1E as well as figure 2 The detailed steps of an exemplary method of the semiconductor device manufacturing method proposed by the embodiment of the present invention will be described. Among them, 1A to Figure 1EA cross-sectional view of a structure formed in related steps of a method for manufacturing a semiconductor device according to an embodiment of the present invention; figure 2 It is a schematic flowchart of a method for manufacturing a semiconductor device according to an embodiment of the present invention.

[0045] The manufacturing method of the semiconductor device of the present embodiment specifically includes the following steps:

[0046] First, if Figure 1A As shown, a first substrate 100 is provided, a radio frequency front-end device including a transistor 102 and a first interconnection structure 103 is formed on the first surface side of the first substrate 100, and a second Interconnect structure 105 . ...

Embodiment 2

[0090] An embodiment of the present invention provides a semiconductor device, which is manufactured by using the manufacturing method in the first embodiment above. The semiconductor device may be an integrated circuit including a radio frequency (RF) device or an intermediate product of an integrated circuit.

[0091] Below, refer to Figure 1E A structure of a semiconductor device proposed by an embodiment of the present invention will be described. in, Figure 1E It is a cross-sectional view of the structure of the semiconductor device according to the embodiment of the present invention.

[0092] Such as Figure 1E As shown, the semiconductor device of this embodiment includes:

[0093] A first substrate 100, a radio frequency front-end device including a transistor 102 and a first interconnection structure 103 and a second interconnection structure 105 located outside the transistor 102 are formed on the first surface side of the first substrate 100 , a through-hole...

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Abstract

The invention provides a semiconductor device and a method of manufacturing the same, and relates to the technical field of semiconductors. The method includes the steps of providing a first substrate, and forming, on a side of a first surface of the first substrate, a radio frequency front-end device including a transistor and a first interconnect structure, and a second interconnect structure located on an outer side of the transistor; providing a second substrate, and bonding the second substrate with a side, on which the radio frequency front-end device is formed, of the first substrate by a bonding process; thinning the first substrate from a side of a second surface, opposite to the first surface, of the first substrate to a first substrate thickness; and forming a backside dielectric layer on the second surface, thinned to the first substrate thickness, of the first substrate, wherein, the first substrate thickness is more than 0.01 times of the minimum feature size of the transistor and less than 10 times of the maximum feature size of the transistor. The manufacturing method of the invention improves the radio frequency performance of the CMOS device by thinning the bulk silicon substrate.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a semiconductor device and a manufacturing method thereof. Background technique [0002] With the improvement of CMOS performance and the integration trend of wireless communication chips, the radio frequency (RF) CMOS process is not only a hot topic in academic research, but also attracts the attention of the industry. The biggest advantage of the RF CMOS process is that it can integrate components such as radio frequency, baseband and memory into a high degree of integration, and at the same time reduce component costs. [0003] RF CMOS technology generally can be divided into two categories: bulk silicon CMOS technology and silicon-on-insulator (SOI) CMOS technology. Among them, the bulk silicon CMOS process has a lower cost than the SOI CMOS process. However, in the traditional bulk silicon CMOS process, the radio frequency characteristics of the device are greatly re...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/8238
CPCH01L21/8238H01L21/823871
Inventor 黄河李海艇朱继光
Owner SEMICON MFG INT (SHANGHAI) CORP