Semiconductor device and method of manufacturing same
A manufacturing method and semiconductor technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve problems such as the reduction of device radio frequency characteristics, and achieve the effect of improving radio frequency performance
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Embodiment 1
[0044] Below, refer to Figure 1A to Figure 1E as well as figure 2 The detailed steps of an exemplary method of the semiconductor device manufacturing method proposed by the embodiment of the present invention will be described. Among them, 1A to Figure 1EA cross-sectional view of a structure formed in related steps of a method for manufacturing a semiconductor device according to an embodiment of the present invention; figure 2 It is a schematic flowchart of a method for manufacturing a semiconductor device according to an embodiment of the present invention.
[0045] The manufacturing method of the semiconductor device of the present embodiment specifically includes the following steps:
[0046] First, if Figure 1A As shown, a first substrate 100 is provided, a radio frequency front-end device including a transistor 102 and a first interconnection structure 103 is formed on the first surface side of the first substrate 100, and a second Interconnect structure 105 . ...
Embodiment 2
[0090] An embodiment of the present invention provides a semiconductor device, which is manufactured by using the manufacturing method in the first embodiment above. The semiconductor device may be an integrated circuit including a radio frequency (RF) device or an intermediate product of an integrated circuit.
[0091] Below, refer to Figure 1E A structure of a semiconductor device proposed by an embodiment of the present invention will be described. in, Figure 1E It is a cross-sectional view of the structure of the semiconductor device according to the embodiment of the present invention.
[0092] Such as Figure 1E As shown, the semiconductor device of this embodiment includes:
[0093] A first substrate 100, a radio frequency front-end device including a transistor 102 and a first interconnection structure 103 and a second interconnection structure 105 located outside the transistor 102 are formed on the first surface side of the first substrate 100 , a through-hole...
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