Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Chip software and hardware simulation environment based on UVM and FPGA

A software and hardware simulation and chip technology, applied in the detection of faulty computer hardware, faulty hardware testing methods, functional inspection, etc., can solve problems such as limited simulation speed, and achieve the effects of improving quality, fast positioning, and speeding up cycle.

Active Publication Date: 2017-12-12
ZHUHAI HUGE IC CO LTD
View PDF5 Cites 39 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, due to the limited simulation speed, UVM verification cannot traverse too many scenarios, which is suitable for small and complex chip verification

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Chip software and hardware simulation environment based on UVM and FPGA

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0029] In order to make the object, technical solution, and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0030] Such as figure 1 As shown, a chip software and hardware simulation environment based on UVM and FPGA, including FPGA verification platform, UVM verification platform, and IP standard model. The IP standard model is connected to the FPGA verification platform, drives the FPGA for simulation verification, and sends the FPGA verification results to the UVM verification platform as the on-site environment configuration. The UVM verification platform is connected to the IP standard m...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a chip software and hardware simulation environment based on the UVM and the FPGA. The simulation environment comprises an FPGA verification platform, a UVM verification platform and an IP standard model. The IP standard model is connected with the FPGA verification platform, and the FPGA is driven to perform simulation verification and sends the FPGA verification result as scene environment configuration to the UVM verification platform. The UVM verification platform is connected with the IP standard model and calls an algorithm in the IP standard model to perform UVM simulation verification to the FPGA verification result. According to the chip software and hardware simulation environment based on the UVM and the FPGA, the IP standard model is connected with the FPGA verification platform and the UVM verification platform, and the software and hardware simulation environment which performs FPGA verification and UVM verification simultaneously is prepared. The FPGA verification focuses on the chip application layer and completes verification of a chip code to a lot of random excitation scenes; the UVM verification focuses on the chip bottom layer and performs further verification to the FPGA verification result by directly calling the algorithm in the IP standard model; the two kinds of verification are mutually matched, the verification period of the chip is accelerated, and the chip verification quality is improved.

Description

technical field [0001] The invention relates to the field of chip simulation verification, in particular to a chip software and hardware simulation environment based on UVM and FPGA. Background technique [0002] In recent years, with the emergence of large-scale SOC and multi-core designs, the design of application-specific integrated chips (ASICs) has become more and more complex, and the functional complexity of chips has increased greatly, making the verification requirements of chips more and more high. How to complete the chip function verification in a short time and ensure the correct logic function puts forward higher requirements for the completeness, automation and reusability of the verification environment. [0003] FPGA verification uses hardware description language to write test cases for the design under test. After simple simulation, the netlist is synthesized and downloaded to the target board for debugging. By observing the output waveform, it is judged w...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F11/26
CPCG06F11/2236G06F11/2273G06F11/261Y02D10/00
Inventor 洪灏
Owner ZHUHAI HUGE IC CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products