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Device and method for actively suppressing jitter of test light path

A technology for testing optical paths and active suppression, which can be used in measuring devices, testing optical performance, optical instrument testing, etc., and can solve problems such as complex design, high cost, and weak high-frequency noise suppression

Pending Publication Date: 2018-01-05
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0003] At present, the commonly used jitter suppression measures mostly act on the optical equipment installation platform. This method is costly, complex in design, and weak in suppressing high-frequency noise.

Method used

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  • Device and method for actively suppressing jitter of test light path
  • Device and method for actively suppressing jitter of test light path
  • Device and method for actively suppressing jitter of test light path

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Experimental program
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Embodiment Construction

[0017] Place the piezoelectric ceramic fast mirror, the second beam splitter, and the shake detection camera at the light input end of the test light path; place the beacon light source and the first beam splitter at the light output end of the test light path. The installation method is shown in the figure. Turn on the beacon light source and adjust the optical path so that the beacon light passes through the piezoelectric ceramic fast mirror and is mounted on the shake detection camera without affecting the test optical path.

[0018] Adjust the energy of the beacon light so that the energy received by the shake detection camera is appropriate. Use the jitter detection camera to measure the jitter of the beacon light entering from the light exit of the test light path at this time, and the jitter form is the form of jitter existing in the test light path.

[0019] The light spot of the test beacon light source is collected by the shake detection camera, and the off-target a...

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Abstract

The present invention discloses a device and method for actively suppressing the jitter of a test light path. The device is formed by beacon light, a light splitter, a piezoelectric fast reflector anda control computer. The overall method comprises steps of transmitting the beacon light at a test light path detection end, using the light splitter to couple and merge the test light, and reverselytransmit the light in the light path to a light entrance end of the test light path. The light entrance end of the test light path is equipped with the piezoelectric fast reflector, the light splitterand a detection camera. Through the light splitter, the beacon light is separated from the test light, the detection camera is used to collect light spot jitter which is test light path jitter. The control computer uses a centroid algorithm to calculate a beacon light miss distance and controls the piezoelectric fast reflector to compensate for the jitter. According to the device and the method,the jitter caused by a platform and other reasons in the test light path can be effectively res suppressed.

Description

technical field [0001] The invention relates to a method for suppressing optical path vibration, in particular to an active suppression method for testing optical path vibration under complex test conditions, which can be used in cross-platform optical path construction, testing and adjustment. Background technique: [0002] In the actual adjustment of optical precision equipment such as large collimator for high-precision testing, the test equipment and the optical path are usually not guaranteed to be on the same platform, and small vibrations on the ground will have a greater impact. For a large device under test, the heavy weight of the device will also cause slight jitter on the platform. This type of jitter is intolerable for high-precision measurement, and certain measures need to be taken to suppress the jitter. [0003] At present, the commonly used jitter suppression measures mostly act on the optical equipment installation platform. This method has high cost, com...

Claims

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Application Information

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IPC IPC(8): G01M11/00G01M11/02
Inventor 贾建军张子玄吴金才张亮强佳
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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