A method and system for measuring camera depth change based on Moiré fringes
A moiré fringe and depth change technology, applied in measurement devices, instruments, optical devices, etc., can solve the problems of inability to meet precise measurement, measurement accuracy changes, measurement range limitations, etc., and achieve easy implementation of experimental environment and low hardware requirements. , the effect of low uncertainty
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0046] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other.
[0047] refer to figure 1 , is an algorithm flow chart of the first embodiment of the present invention. The invention provides a method for measuring the depth change of a camera based on Moiré fringes, which comprises the following steps:
[0048] Acquire the reference raster image;
[0049] Change the depth of the camera and collect the raster image at this time;
[0050] performing beat frequency processing on the two grating images to obtain synthesized moiré fringes, and extracting the frequency of the moiré fringe images;
[0051] According to the frequency information of the moire fringe image, the depth variation of the camera is further obtained.
[0052] As an improvement of the technical solution, the method further includes performing Fourier transform on the moiré image to obtain the frequ...
PUM
![No PUM](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com