EPC3C120F484 type FPGA (Field Programmable Gate Array) configuration/testing/debugging adapter

Abstract

The invention discloses an EPC3C120F484 type FPGA (Field Programmable Gate Array) configuration / testing / debugging adapter, and aims to provide an FPGA large-scale integrated circuit testing and debugging adapter which is convenient to operate, high in work efficiency, low in quality loss and accurate and reliable in test result. The invention is implemented according to the following technical scheme: a configuration mode selection circuit (2), interface circuits (3), a power supply circuit (4), a state display circuit (5) and a storage configuration circuit (6) are electrically connected around a test socket (1). The storage configuration circuit is prestored with function configuration files of an FPGA large-scale integrated circuit, the power supply circuit powers a device under test online, the configuration mode selection circuit selects a configuration interface to perform logical function configuration on the device under test through the interface circuit according to a masterserial configuration mode, whether the configuration of the device under test is normal or not is verified through an indicator light of the state display circuit, and function and performance testingcan be performed through automatic test equipment (ATE) after the logic function configuration is completed.

Description

Technical field [0001] The invention mainly relates to a large-scale integrated circuit (LSIC) EPC3C120F484 field programmable gate array (FPGA) configuration, test and debug adapter. Background technique [0002] With the development of science and technology, the level of integrated circuit production technology has improved, and the integration of digital circuits has become larger and larger, from small-scale (SSIC), medium-scale (MSIC), large-scale integrated circuits (LSIC) to very large-scale integrated circuits ( VLSIC), and more and more varieties. Among them, field programmable gate array FPGA devices have become the most attractive semiconductor devices in the world today. Due to the advantages of small size, high integration, low power consumption, fast speed, and unlimited repeated programming of FPGA devices, users can not only design various special integrated circuit chips in a short period of time with the help of the development system, but also conveniently C...

AI Technical Summary

Problems solved by technology

This not only increases the manufacturing cost and prolongs the production cycle, but also causes complicated operation, prolonged time-consuming, and wear and tear of components due to frequent change of fixtures.

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