Porous transparent member

Abstract

The invention discloses a porous transparent member which is a thin-walled copper structural part and has n large through holes penetrating the thin wall. The shape curve of the large through holes isa closed curve formed by reducing the distance between the left and right focus points of an ellipse formed by the oblique section of a cone to 2 / 3-1 / 3 of the original distance. The transparent member has m small through holes at the edge. Stray light is filtered out via the through holes, and the influence of stray light is reduced. The light throughput is retained to the maximum. The phenomenonof light leakage is avoided. The porous transparent member plays a role in reducing noise and improving the sensitivity and precision of sequential wavelength dispersive X fluorescence spectrum analysis in a sequential wavelength dispersive X fluorescence spectrometer, and has obvious advantages.

Description

technical field [0001] The invention relates to the field of sequential wavelength dispersion X-ray fluorescence spectrum detection, in particular to a light-transmitting component using a multi-collimator device in a sequential wavelength dispersion X-ray fluorescence spectrometer. Background technique [0002] Sequential wavelength dispersive X-ray fluorescence spectrometer uses primary X-rays or other photon sources to excite atoms in the substance to be measured to generate fluorescence (secondary X-rays). An instrument for analyzing the composition of substances. X-ray fluorescence spectrometer, also known as XRF spectrometer, has two types: dispersive type and non-dispersive type. It has the advantages of not destroying the sample, fast analysis speed, suitable for the determination of all chemical elements with atomic number above 4, high analysis precision and simple sample preparation. [0003] The original sequential wavelength dispersive X-ray fluorescence spect...

AI Technical Summary

Problems solved by technology

[0003] The original sequential wavelength dispersive X-ray fluorescence spectrometer uses a single collimator for substance analysis. In the process of analyzing different substances, it needs to be adjusted and replaced many times, and even different types of collimators may need to be changed. In order to operate Convenience, resulting in a sequential wavelength dispersive X-ray fluorescence spectrometer using multiple collimators, but in the process of use, no matter which application field the sequential wavelength dispersive X-ray fluorescence spectrum is applied to, it will encounter a general normal light shape There will be light leakage and other phenomena in the through hole, which will cause distortion or inaccuracy in material measurement. Therefore, it is necessary to deal with the shape of the through hole and find a solution that can meet the needs of use.

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