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Detection platform of integrated circuit board

A technology for integrated circuit boards and testing tables, which is applied in the field of testing tables and can solve problems such as inability to rotate detection, easily damaged integrated circuit boards, inconvenient detection, etc.

Inactive Publication Date: 2018-02-13
郑世珍
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to overcome the disadvantages in the prior art that the periphery of the integrated circuit board cannot be rotated, it is inconvenient to detect the back of the integrated circuit board, and it is easy to damage the integrated circuit board, the technical problem to be solved by the present invention is to provide a device that can rotate and detect the periphery of the integrated circuit board. , it is convenient to detect the back of the integrated circuit board, and the integrated circuit board inspection table is not easy to damage the integrated circuit board

Method used

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  • Detection platform of integrated circuit board
  • Detection platform of integrated circuit board
  • Detection platform of integrated circuit board

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0034] A kind of integrated circuit board testing station, such as Figure 1-7 As shown, it includes a first bracket 1, a placement plate 2, a rotating mechanism 3 and a fixing mechanism 4. The top of the first bracket 1 is connected with a placement plate 2, and the top of the placement plate 2 is connected with a rotation mechanism 3. The rotation mechanism 3 is provided with a fixed Institution 4.

Embodiment 2

[0036] A kind of integrated circuit board testing station, such as Figure 1-7 As shown, it includes a first bracket 1, a placement plate 2, a rotating mechanism 3 and a fixing mechanism 4. The top of the first bracket 1 is connected with a placement plate 2, and the top of the placement plate 2 is connected with a rotation mechanism 3. The rotation mechanism 3 is provided with a fixed Institution 4.

[0037] Turning mechanism 3 includes curved slide rail 31, first slide block 32, second support 33, first steel wire rope 34, first guide wheel 35, first spring 36 and first pole 37, places board 2 tops and is connected with Curved slide rail 31, the left and right sides in the middle of the curved slide rail 31 are all slidably connected with the first slider 32, the bottom of the first slider 32 on the left and right sides is connected with the second bracket 33, the first slider 32 on the left and right sides The outside of slide block 32 is connected with the first wire rope...

Embodiment 3

[0039] A kind of integrated circuit board testing station, such as Figure 1-7 As shown, it includes a first bracket 1, a placement plate 2, a rotating mechanism 3 and a fixing mechanism 4. The top of the first bracket 1 is connected with a placement plate 2, and the top of the placement plate 2 is connected with a rotation mechanism 3. The rotation mechanism 3 is provided with a fixed Institution 4.

[0040] Turning mechanism 3 includes curved slide rail 31, first slide block 32, second support 33, first steel wire rope 34, first guide wheel 35, first spring 36 and first pole 37, places board 2 tops and is connected with Curved slide rail 31, the left and right sides in the middle of the curved slide rail 31 are all slidably connected with the first slider 32, the bottom of the first slider 32 on the left and right sides is connected with the second bracket 33, the first slider 32 on the left and right sides The outside of slide block 32 is connected with the first wire rope...

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PUM

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Abstract

The invention relates to a detection platform, in particular to a detection platform of an integrated circuit board, which aims at providing a detection platform of the integrated circuit board with the advantages that the surrounding of the integrated circuit board can be rotationally detected; the back surface of the integrated circuit board can be conveniently detected; the easiness in damage to the integrated circuit board is avoided. To achieve the aim, the detection platform of the integrated circuit board comprises a first bracket and the like, wherein the top part of the first bracketis connected with a placement plate; the top part of the placement plate is connected with a rotation mechanism; a fixed mechanism is arranged in the rotation mechanism. The detection platform of theintegrated circuit board has the advantages that a user pulls and releases a first steel wire rope at the right side, so that a second bracket is alternatively rotated with certain angle in clockwiseand counterclockwise ways, and the user can detect the certain rotation angle rotated by the circuit board; by utilizing the light ray reflection function of a plane mirror, the user can detect the integrated circuit board without turning over the integrated circuit board.

Description

technical field [0001] The invention relates to a testing platform, in particular to an integrated circuit board testing platform. Background technique [0002] An integrated circuit board is a tiny electronic device or component. Using a certain process, the transistors, resistors, capacitors, inductors and other components required in a circuit are interconnected, and they are fabricated on a small or several small semiconductor wafers or dielectric substrates, and then packaged in a tube. , and become a microstructure with required circuit functions; all the components in it have been structurally integrated, making electronic components a big step towards miniaturization, low power consumption, intelligence and high reliability. It is represented by the letter "IC" in the circuit. The inventors of the integrated circuit are Jack Kilby (germanium-based integrated circuits) and Robert Noyce (silicon-based integrated circuits). Most of today's semiconductor industry uses...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/04
Inventor 周晓东张健刘超群阳冬
Owner 郑世珍