High-frequency large-wafer bicrystal longitudinal wave probe

Abstract

The invention discloses a high-frequency large-chip double-crystal longitudinal-wave probe, which includes a shell, a cable lead, a sound-permeable wedge, a damping block, and a piezoelectric wafer. The shell is divided into two symmetrical cavities by a sound-insulating layer in the middle. The cable lead wire, the sound-transmitting wedge, the damping block, and the piezoelectric chip are two and symmetrically distributed in the two cavities. The sound-transmitting wedge has a right-angled triangle cross section, and the sound-transmitting wedge is fixed on the wear-resistant layer on the bottom surface of the shell. The piezoelectric chip is mounted on the sound-transmitting wedge, and the damping block is arranged on the upper surface of the sound-transmitting wedge. The piezoelectric chip is respectively connected to the cable joint outside the shell through the cable lead wire, and the cavity of the shell is covered with sound-absorbing material . The probe has high frequency and good resolution, and has high detection sensitivity to the layered defects of the base metal of the steel plate when detecting thin-walled steel plates.

Description

technical field [0001] The invention relates to a tool for ultrasonic detection of steel plates, in particular to a high-frequency large-chip double-crystal longitudinal wave probe for ultrasonic longitudinal wave detection of thin-walled steel plates. Background technique [0002] With the rapid development of my country's economy, the demand for steel pipe products is increasing, and the requirements for its quality are becoming more and more stringent. In the production process of the steel pipe, in order to control the quality of the steel pipe, it is necessary to detect the delamination defects of the base metal of the steel pipe. When using a longitudinal wave probe with a frequency of 2 to 5 MHz, the detection resolution of the upper and lower near-surface defects of the thin-walled steel plate is not clear enough. In response to this situation, we have developed a high-frequency large-chip dual-element longitudinal wave probe. This probe has high frequency and good ...

AI Technical Summary

Problems solved by technology

When using the longitudinal wave probe with a frequency of 2 ~ 5MHz in the detection process, the resolution of the detection of the upper and lower near-surface defects of the thin-walled steel plate is not clear enough, and it is difficult to distinguish the bottom wave from the defect wave, which may easily cause the layered defects of the thin-walled steel plate base metal to be missed.

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