High-frequency large-wafer bicrystal longitudinal wave probe

Abstract

The invention discloses a high-frequency large-wafer bicrystal longitudinal wave probe, which comprises a case, two cable lead wires, two acoustic transmission wedges, two damping blocks and two piezoelectric wafer, wherein the case is divided into two symmetrical cavities by a sound insulation layer at the middle part; the two cable lead wires, the two acoustic transmission wedges, the two damping blocks and the two piezoelectric wafers are symmetrically distributed in the two cavities; the cross section of the acoustic transmission wedge is a right triangle; each acoustic transmission wedgeis fixed on a wear-resistant layer of the bottom surface of the case; each piezoelectric wafer is arranged on the corresponding acoustic transmission wedge in an attached way; each damping block is arranged on the upper surface of the corresponding acoustic transmission wedge; each piezoelectric wafer is connected with cable connectors arranged at the outer part of the case through the cable leadwires; sound absorption materials are fully distributed in the cavities of the case. The probe has the advantages that the frequency is high; the resolution ratio is good; during thin-wall steel platedetection, high detection sensitivity is realized on the lamination defect of a parent metal of a steel plate.

Description

technical field [0001] The invention relates to a tool for ultrasonic detection of steel plates, in particular to a high-frequency large-chip double-crystal longitudinal wave probe for ultrasonic longitudinal wave detection of thin-walled steel plates. Background technique [0002] With the rapid development of my country's economy, the demand for steel pipe products is increasing, and the requirements for its quality are becoming more and more stringent. In the production process of the steel pipe, in order to control the quality of the steel pipe, it is necessary to detect the delamination defects of the base metal of the steel pipe. When using a longitudinal wave probe with a frequency of 2 to 5 MHz, the detection resolution of the upper and lower near-surface defects of the thin-walled steel plate is not clear enough. In response to this situation, we have developed a high-frequency large-chip dual-element longitudinal wave probe. This probe has high frequency and good ...

AI Technical Summary

Problems solved by technology

When using the longitudinal wave probe with a frequency of 2 ~ 5MHz in the detection process, the resolution of the detection of the upper and lower near-surface defects of the thin-walled steel plate is not clear enough, and it is difficult to distinguish the bottom wave from the defect wave, which may easily cause the layered defects of the thin-walled steel plate base metal to be missed.

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