A method for identifying short-circuit faults inside hbsm-mmc based on AND-OR logic
A short-circuit fault and logic technology, applied in the direction of instruments, measuring devices, measuring electricity, etc., can solve the problems of failure characteristic analysis that cannot directly use MMC, no protection scheme is given, and IGBT short-circuit identification is not possible.
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[0049] The technical solution of the present invention will be further described below in conjunction with the accompanying drawings.
[0050] The simulation model used for the IGBT open circuit fault identification method in the HBSM-MMC is as follows: figure 1 as shown, figure 2 It is a flow chart of short-circuit fault identification in HBSM using this method. The present invention proposes a method for identifying HBSM-MMC internal IGBT short-circuit faults based on "AND" and "OR" logic. The method can quickly and accurately identify and locate faulty HBSMs and power devices. The specific process of the program is:
[0051] (1) Monitor the state S of the nth HBSM n :
[0052] Use S n Indicates the working status of the nth HBSM, and makes the following provisions:
[0053]
[0054] Wherein, n=1, 2...2N, N is the number of cascaded HBSMs of the upper and lower bridge arms.
[0055] (2) Monitor the capacitor voltage u of the nth HBSM cn , calculate its capacitive...
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