Magnetic atomic force microscope probe adopting magnetic nanowires

An atomic force microscope and magnetic nanotechnology, applied in scanning probe technology, scanning probe microscopy, measuring devices, etc., can solve problems such as unproposed solutions, achieve the goal of improving service life, solving bottlenecks, and improving consistency Effect

Inactive Publication Date: 2018-03-09
苏州泰岩新材料有限公司
View PDF8 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] For the problems in the above-mentioned related technologies, no effective solution has been proposed yet

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Magnetic atomic force microscope probe adopting magnetic nanowires

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. All other embodiments obtained by persons of ordinary skill in the art based on the embodiments of the present invention belong to the protection scope of the present invention.

[0017] The invention adopts the conventional atomic force microscope probe as the basis, and utilizes the advantages of the probe being easy to obtain, cheap, diverse and optional, and stable. At the same time, the advantages of large aspect ratio and ultra-high resolution of magnetic nanowires are used to prepare a magnetic atomic force microscope probe with excellent performance.

[0018] Such as figure 1 As shown, the magnetic atomic force microscope probe according to the embodiment of t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a magnetic atomic force microscope probe adopting magnetic nanowires and a manufacturing method thereof, so as to solve the bottleneck problem of the current magnetic atomic force microscope probe and greatly improve the service life and the resolution of the atomic force microscope probe. The magnetic nanowire probe can be manufactured by adopting a direct bonding method and a chemical vapor deposition growth method. The ultra-high resolution and the ultra long service life of the magnetic one-dimensional nano material probe are made full use of to solve the problems of short service life, easy wear and the like for a long time of the magnetic atomic force microscope probe test, the test consistency is improved, and needs of different application fields such as scientific research, production and teaching can be met.

Description

【Technical field】 [0001] The invention relates to the field of atomic force microscopy, in particular to a long-life high-resolution magnetic atomic force microscopy probe and a preparation method thereof. 【Background technique】 [0002] Atomic Force Microscope (AFM, Atomic Force Microscope) is an important instrument with atomic-level resolution for the analysis of surface morphology, heat, force, electricity, magnetism, optics and other properties. An important characterization tool in the life sciences and more. An atomic force microscope scans the surface of a sample with a very sharp tip attached to a cantilever. The force deflection of the cantilever is detected by the position change of the reflected light of the laser beam, and then processed by a computer to generate a surface topography image. Among them, the AFM probe is the key sensor in the atomic force microscope. As a daily consumable, its main manufacturers are distributed in Germany, Switzerland, the Unit...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/38G01Q70/16
CPCG01Q60/38G01Q70/16
Inventor 不公告发明人
Owner 苏州泰岩新材料有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap