Four-camera planar array feature point matching method and measurement method based on it

A feature point matching and planar array technology, which is applied to measuring devices, computer components, instruments, etc., can solve the problems of manual processing of measured objects

Active Publication Date: 2018-09-04
BEIJING QINGYING MACHINE VISUAL TECH CO LTD
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  • Abstract
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  • Claims
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Problems solved by technology

However, the method of pasting marker points on the surface of the object has the disadvantage of requiring manual processing and intervention on the object in advance

Method used

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  • Four-camera planar array feature point matching method and measurement method based on it
  • Four-camera planar array feature point matching method and measurement method based on it
  • Four-camera planar array feature point matching method and measurement method based on it

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Embodiment Construction

[0064] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described The embodiments are some of the embodiments of the present invention, not all of the embodiments. Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0065] In the description of the present invention, it should be understood that...

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Abstract

The invention relates to a four-camera plane array feature point matching method and a measurement method based on the four-camera plane array feature point matching method, belonging to the field of optical and electronic measurement. The matching method includes taking one of the four image planes as the base image plane, and finding a feature point that matches the feature point on an image plane adjacent to the base image plane in the lateral direction for a feature point on the base image plane. All matching points; for the feature points on the base image plane, find out all the matching points that match the feature points on the image plane adjacent to the base image plane in the longitudinal direction; all the found horizontal and vertical directions The matching points are re-matched to find out all sub-matching point groups; find out the matching points corresponding to the feature points on the diagonal position image plane and the base image plane and all found sub-matching point groups; determine the matching points in the four image planes A unique matching point group corresponding to the same viewpoint. For each unique matching point group, the three-dimensional space coordinates of the viewpoint can be calculated according to the image coordinates of the matching point group and the parameters of the camera system itself. Under any lighting conditions, as long as the collected images are clear enough, for any object that is imaged on the image of the four-camera planar array and has certain image characteristics, the exact same matching method and measurement method can be used to achieve the object’s detection. 3D measurement.

Description

technical field [0001] The invention relates to the technical field of optical and electronic measurement; in particular, it relates to a four-camera plane array feature point matching method and a measurement method based on the four-camera plane array feature point matching method. Background technique [0002] At present, three-dimensional stereo vision measurement generally adopts line laser light screenshot measurement technology or binocular measurement plus structured light illumination. The corresponding matching points are clarified in the imaging, the ambiguity of matching is reduced, and a definite and unique matching is realized. However, if the indication of line laser or structured light is canceled, binocular matching cannot avoid the ambiguity of multi-point matching, so that the measurement requirements cannot be met. At the same time, line laser or structured light can only be used for line laser or structured light imaging. Measurements limit the scope of...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00G01B11/24
CPCG06T7/73H04N13/106H04N13/189H04N13/243G01B11/00G01B11/002
Inventor 曹亮尹兴
Owner BEIJING QINGYING MACHINE VISUAL TECH CO LTD
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