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Bonding pad structure and method of manufacturing the same

A manufacturing method and bonding pad technology, which are used in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve problems such as electrical conduction failure, damage to the bonding pad structure, and weak bonding pad structure, and achieve enhanced mechanical strength, The effect of preventing current congestion and preventing damage

Active Publication Date: 2020-05-26
VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, the bond pad structure described above is not robust
For example, the via plug is easy to conduct the stress generated in the wire bonding process and damage the bonding pad structure, resulting in electrical conduction failure

Method used

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  • Bonding pad structure and method of manufacturing the same
  • Bonding pad structure and method of manufacturing the same
  • Bonding pad structure and method of manufacturing the same

Examples

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Embodiment Construction

[0051] The bonding pad structure and manufacturing method of the embodiments of the present invention are described below. However, the embodiments provided by the present invention are only used to illustrate the specific method of making and using the present invention, and are not intended to limit the scope of the present invention.

[0052] Embodiments of the present invention provide a bonding pad structure, such as a circuit under bonding pad (CUP) structure, which utilizes a metal pattern layer with a hollow pattern and an island pattern located under the bonding pad and between the bonding pad and the metal pattern layer. The internal connection structure (for example, via layer plug) can strengthen the mechanical strength of the bonding pad, and at the same time, the metal pattern layer can be used to transmit two different signals.

[0053] Please refer to Figure 1A and Figure 1B ,in Figure 1A A cross-sectional schematic diagram of a bonding pad structure accord...

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PUM

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Abstract

The invention provides a bonding pad structure and a manufacturing method thereof. The bonding pad structure comprises a dielectric layer arranged on a substrate; and a bonding pad arranged on the dielectric layer. A first metal pattern layer is embedded in the dielectric layer and located right under the bonding pad. The first metal pattern layer comprises a first body portion and a plurality offirst island-shaped portions. The first body portion is provided with a plurality of first openings arranged in the central region of the first body portion and a plurality of second openings arrangedalong the periphery region of the first body portion and configured to surround the first openings. The first island-shaped portions are correspondingly arranged in the second openings and are separated from the first body portion. A plurality of first inner connection structures are arranged in the dielectric layer and correspond to the first island-shaped portions. Each first inner connection structure comprises at least one dielectric layer plug, so that the bonding pad is electrically connected to the first island-shaped portions. According to the invention, two different signals can be transmitted by utilizing the first metal pattern layer. Therefore, the mechanical strength of the bonding pad can be enhanced by filling the dielectric layer into the first openings. The bonding pad can be prevented from being damaged during the wire bonding process.

Description

technical field [0001] The present invention relates to a semiconductor technology, and in particular to a bonding pad structure and a manufacturing method thereof. Background technique [0002] In a semiconductor chip, a bonding pad is a necessary component for electrically connecting an integrated circuit in a semiconductor chip with an external circuit. Traditionally, in order to prevent the integrated circuits in the chip from being damaged, the integrated circuits are usually not disposed under the bonding pads. In this way, since the integrated circuit does not overlap with the bonding pads, the semiconductor chip needs to have a larger area to provide enough space for the bonding pads to be disposed. However, although the semiconductor industry is constantly improving the packing density of various electronic components (eg, transistors, diodes, resistors, capacitors, etc.) area to place electronic components and bonding pads. [0003] Therefore, circuit designers ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/48H01L21/768
CPCH01L21/4814H01L21/4842H01L21/768H01L21/76895
Inventor 涂祈吏陈宏维吕世襄王靖雯
Owner VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION