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Single-generation ultra-short laser pulse width measurement device and measurement method

An ultra-short laser and pulse width technology, applied in instruments and other directions, can solve problems such as difficult implementation, complexity, and inability to provide pulse phase information, and achieve the effect of wide application range and high time resolution.

Pending Publication Date: 2018-04-06
LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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Problems solved by technology

Among them, the correlation method can be used to measure the pulse width, but the correlation signal cannot give the pulse waveform, and the pulse waveform needs to be assumed in advance, so the correlation method can give the chirp of the pulse, but it cannot provide the phase information of the pulse
The frequency-resolved optical shutter and the self-reference spectral phase coherent electric field reconstruction method can not only give the phase information of the pulse spectrum, but also measure the pulse time-domain waveform, but these two methods are much more complicated than the correlation method, and the implementation is difficult.
[0003] Moreover, the above three methods can only measure repeated ultrashort laser pulses, and cannot measure the width of a single ultrashort laser pulse

Method used

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  • Single-generation ultra-short laser pulse width measurement device and measurement method
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Embodiment Construction

[0032] The present invention will be further described below in conjunction with embodiment and accompanying drawing.

[0033] Such as figure 1 and figure 2 As shown, a single-shot ultrashort laser pulse width measuring device is characterized in that it includes a beam splitter 1, a CCD21, a first optical path A, a second optical path B, a Kerr effect module C and an imaging module D; to be measured A beam of ultrashort laser pulses is transmitted by the beam splitter 1 to form a beam of pump light, and reflected to form a beam of probe light. The pump light and probe light enter through the first optical path A and the second optical path B respectively. Kerr effect module C, part of the probe light emitted from the Kerr effect module C is imaged onto the CCD21 through the imaging module D, wherein the pump light emitted from the first optical path A and the probe light emitted from the second optical path B The included angle between the directions of propagation is grea...

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Abstract

The invention discloses a single-generation ultra-short laser pulse width measurement device and a single-generation ultra-short laser pulse width measurement method. The single-generation ultra-shortlaser pulse width measurement device comprises a beam splitter, a CCD, a first optical path, a second optical path, a kerr effect module and an imaging module. Based on the single-generation ultra-short laser pulse width measurement device and the single-generation ultra-short laser pulse width measurement method, the pulse width of the ultra-short laser pulse can be measured through the opticalkerr effect based on the inclination of wavefront. Only through changing an included angle formed between the pumping light and the detection light emitted from the first optical path and the second optical path, the measurement resolution and the time window can be adjusted. Therefore, the device and the method are wide in application range. Not only the width of the ultra-short pulse laser can be measured, but also the pulse width ranging from the visible spectrum to the near-infrared spectrum can be measured. The advantages of high time resolution, tunable property, wide application range and the like are realized.

Description

technical field [0001] The invention belongs to the technical field of ultrashort pulse measurement, and in particular relates to a single-shot ultrashort laser pulse width measurement device and a measurement method. Background technique [0002] Currently, there are various methods for measuring laser pulse width. However, the fastest response time of existing optoelectronic devices is on the order of ps. Therefore, these optoelectronic devices cannot be directly used to measure the pulse width of femtosecond lasers. At present, femtosecond laser pulse width can only be measured by femtosecond laser itself. There are three commonly used methods: autocorrelation method, frequency-resolved optical shutter (FROG) and self-referencing spectral phase coherent electric field reconstruction method (SPIDER). Among them, the correlation method can be used to measure the pulse width, but the correlation signal cannot give the pulse waveform, and the pulse waveform needs to be assum...

Claims

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Application Information

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IPC IPC(8): G01J11/00
CPCG01J11/00
Inventor 刘祥明彭晓世理玉龙徐涛查为懿魏惠月梅雨刘永刚关赞洋杨冬王峰刘慎业
Owner LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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