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Two-slit-switching two-dimensional high-resolution spectrograph optical system

A high-resolution, optical system technology, applied in the field of two-dimensional high-resolution spectrometer optical system, can solve the problems of not being able to meet the application requirements of atomic emission spectrometers and limited wave bands, and achieve interference avoidance, high spectral resolution, and guaranteed spectral The effect of resolution

Active Publication Date: 2018-04-20
NCS TESTING TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This technology avoids the uneven spectral distribution caused by the nonlinear dispersion of the prism, but the wavelength range is only 120nm-480nm, and the wavelength band is limited, which cannot well meet the application requirements of atomic emission spectrometers.

Method used

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  • Two-slit-switching two-dimensional high-resolution spectrograph optical system
  • Two-slit-switching two-dimensional high-resolution spectrograph optical system
  • Two-slit-switching two-dimensional high-resolution spectrograph optical system

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Embodiment

[0049] In this embodiment, the wavelength range used by the optical system is designed to be 178-550 nm, and is not limited to this wavelength range.

[0050] The selected cylinder 6 is the SMC miniature cylinder CJ1 series, which has stable performance and ensures the stable switching of the switching prism 3.

[0051] Figure 3a , Figure 3b It is a schematic diagram of the spectra of the short-wave band and the long-wave band respectively collected by the optical system of the present embodiment, Figure 4 It is a schematic diagram of a full-spectrum primary imaging in the prior art.

[0052] It can be clearly seen that Figure 3a , Figure 3b Compared with the interval between adjacent diffraction orders in the long wave band Figure 4 be effectively relieved. Figure 3b The interval between adjacent diffraction orders near 550nm in the medium and long wave band is 3.5pixel, and the interval between adjacent diffraction orders near 178nm is 21.9pixel. corresponding ...

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Abstract

The invention, which belongs to the technical field of optical system design and optical instruments, in particular relates to a two-slit-switching two-dimensional high-resolution spectrograph opticalsystem comprising a light source (1), a pre light path (2), a two-slit-switching mechanism and a light splitting system. The two-slit-switching mechanism consists of an adjustable switching prism (3), a first slit (4) and a second slit (5). The light splitting system includes a collimating mirror (7), a beam splitter prism (8), a middle stepped grating (9), a focusing lens (10), and an area arrayCCD (11). A light beam emitted by the first slit (4) or the second slit (5) is collimated by the collimating mirror (7) into a parallel beam; the parallel beam passes through the beam splitter prism(8), the middle stepped grating (9), and the focusing lens (10) and then is reflected and focused to the area array CCD (11) of the detector. The area array CCD (11) is able to receive spectral information of two wavebands of a short wave band and a long wave band. The system has advantages of high spectral resolution, large luminous flux in the short wavelength band system, and effective reduction of diffraction-order interference.

Description

technical field [0001] The invention belongs to the field of optical system design and optical instrument technology, in particular to a double-slit switching two-dimensional high-resolution spectrometer optical system. Background technique [0002] In recent years, atomic emission spectrometers are constantly developing in the direction of full-spectrum direct reading, intelligence, miniaturization, and low analysis cost. As the core part of the atomic emission spectrometer, the spectroscopic system directly determines the performance level of the overall instrument. [0003] At present, common spectrometer structures include Czerny-Turner, Paschen-Runge structure, flat-field concave grating spectroscopic system, echelle two-dimensional spectroscopic system, etc. Among them, the high-resolution échelle grating two-dimensional spectroscopic system is a full-spectrum spectrometer with low dispersion prism and high dispersion échelle grating cross dispersion. Forming two-dim...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/28G01J3/02G01J3/04
CPCG01J3/0291G01J3/04G01J3/2803
Inventor 曹海霞何淼赵英飞夏钟海
Owner NCS TESTING TECH