An automatic simulation test method for SOC chips based on image acceleration processing

A simulation test and chip technology, applied in electrical digital data processing, error detection/correction, detection of faulty computer hardware, etc., can solve problems such as slow comparison of results, low efficiency of the image processing module test process, and difficulty in locating error points.

Active Publication Date: 2019-03-29
BEIJING INST OF REMOTE SENSING EQUIP
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Problems solved by technology

[0005] The purpose of the present invention is to provide an automatic simulation test method for SoC chips based on image acceleration processing, which solves the problems of low efficiency of image processing module test process, slow result comparison, and difficult location of error points

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  • An automatic simulation test method for SOC chips based on image acceleration processing

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[0053] An SoC chip automatic simulation test system for image acceleration processing, including: multi-standard test data generation module 1, software function driver module 2, configurable precision algorithm golden model module 3, test incentive and comparison result database 4 and automatic comparison test Results module 5.

[0054] The function of the multi-standard test data generation module 1 is: generate image data of various widths, and generate test data in corresponding storage formats according to the bit widths of different storage areas of the SoC chip;

[0055] The functions of the software function driver module 2 are: perform driver configuration according to the functional requirements of the image acceleration processing module to be tested, select and configure linear or nonlinear correction, Gaussian, gradient or median filtering;

[0056] The function of module 3 of the golden model of configurable precision algorithm is: to construct the golden model o...

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Abstract

The invention discloses an SoC chip automatic simulation testing method based on image acceleration processing. The method is completed by a multi-scale testing data generating module (1), a softwarefunction driving module (2), a distributable precision algorithm golden model module (3), a testing motivation and comparison result database module (4) and an automatic result comparison module (5).The multi-scale testing data generating module (1) is configured to generate testing date according to demands, the software function driving module (2) and the distributable precision algorithm golden model module (3) generate the testing motivation and comparison result database module (4), and finally the automatic result comparison module (5) is utilized to compare testing results and locate errant function points. The method solves the problems that the quantity of testing function points of an SoC chip image acceleration processing module is excessively large, and the verification time is long; the testing data can be automatically generated, functional design index detection is completed, and the purpose of fast locating hardware design problems is achieved.

Description

technical field [0001] The invention relates to a co-simulation method, in particular to an automatic simulation test method for an SoC chip based on image acceleration processing. Background technique [0002] With the rapid development and deployment of high-resolution sensors, the application of image processing has gradually expanded, involving aerospace, medicine, astronomy, earth science, biological science, agriculture, military and other fields, and the requirements for image processing performance are increasing day by day. Some leading chip companies in the technical field have developed chips with image acceleration processing functions according to this requirement. "Precise Guide No. 2" is such a chip with high-performance image processing capabilities, which can correct and filter multi-size images and meet the needs of image preprocessing in most fields. The quality of this module is directly related to the quality of subsequent image processing, so the verif...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/26
CPCG06F11/261
Inventor 李欣致刘志哲马承光田映辉郑维维
Owner BEIJING INST OF REMOTE SENSING EQUIP
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