An automatic simulation test method for SOC chips based on image acceleration processing
A simulation test and chip technology, applied in electrical digital data processing, error detection/correction, detection of faulty computer hardware, etc., can solve problems such as slow comparison of results, low efficiency of the image processing module test process, and difficulty in locating error points.
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[0053] An SoC chip automatic simulation test system for image acceleration processing, including: multi-standard test data generation module 1, software function driver module 2, configurable precision algorithm golden model module 3, test incentive and comparison result database 4 and automatic comparison test Results module 5.
[0054] The function of the multi-standard test data generation module 1 is: generate image data of various widths, and generate test data in corresponding storage formats according to the bit widths of different storage areas of the SoC chip;
[0055] The functions of the software function driver module 2 are: perform driver configuration according to the functional requirements of the image acceleration processing module to be tested, select and configure linear or nonlinear correction, Gaussian, gradient or median filtering;
[0056] The function of module 3 of the golden model of configurable precision algorithm is: to construct the golden model o...
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