Single event functional interrupt protection system and method for CMOS image sensor

An image sensor, single-particle technology, applied in image communication, TV system parts, color TV parts and other directions, can solve problems such as image anomalies, and achieve the effect of improving photographic efficiency and reliability

Active Publication Date: 2018-05-18
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0008] Aiming at the problem that the single-event function interruption of the existing CMOS image sensor causes image abnormality during the photographing process of the orbital period space camera, the embodiment of the present invention proposes a single-event function interruption protection system for the CMOS image sensor and the corresponding method
The single event function interruption protection system of the CMOS image sensor receives the corre...

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  • Single event functional interrupt protection system and method for CMOS image sensor

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Embodiment Construction

[0031] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0032] The terms "first", "second", "third", "fourth", etc. (if any) in the description and claims of the present invention and the above drawings are used to distinguish similar objects and not necessarily Describe a specific order or sequence. It is to be understood that the terms so used are interchangeable under appropriate cir...

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Abstract

The embodiment of the invention discloses a single event functional interrupt protection system and corresponding method for a CMOS image sensor. The protection system comprises the CMOS image sensor,a functional interrupt protection control FPGA, a serial communication interface chip and a data transmission interface chip, wherein the CMOS image sensor is used for converting an optical signal into a digital image signal; the functional interrupt protection control FPGA is used for receiving and processing the digital image signal generated by the CMOS image sensor and providing a preset signal for the CMOS image sensor; the serial communication interface chip is used for transmitting a related state signal to the functional interrupt protection control FPGA; and the data transmission interface chip is used for transmitting the digital image signal processed by the functional interrupt protection control FPGA to a data transmission subsystem. The single event functional interrupt protection system and corresponding method for the CMOS image sensor, which are disclosed by the embodiment of the invention, solve the problem of image anomaly in the orbital period space camera shootingprocess, which is caused by a case that the single event functional interrupt occurs to an existing CMOS image sensor.

Description

technical field [0001] The invention relates to the technical field of a space camera using a CMOS image sensor, in particular to a system for protecting against single event function interruption of a CMOS image sensor of a space camera, and also relates to a protection method corresponding to the system. Background technique [0002] Space cameras use spacecraft as observation platforms to image other celestial bodies such as the Earth, the Moon, or Mars. Because there are a large number of γ-rays, X-rays, electrons, protons, neutrons and various heavy ions in the space (especially the space outside the earth's atmosphere), there is a space radiation effect in the space. The space radiation effect will damage the photoelectric devices in the space camera, which will lead to abnormal or malfunction of the space camera. Space radiation effects mainly include total radiation dose, single event effects and displacement effects. Among them, the single event effect refers to t...

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Application Information

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IPC IPC(8): H04N5/374H04N5/3745
CPCH04N25/76H04N25/77
Inventor 武星星杨亮王灵杰刘金国徐东孔德柱周怀得
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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