Universal emccd test system

Abstract

The invention discloses a universal EMCCD test system, including an NI host, an EMCCD device base, a serial port adapter board, a differential signal adapter board, a VPC series connector, a low-voltage differential level switching circuit, a sine wave driving circuit, a programmable power circuit, a backplane, a correlated double sampling circuit and a power supply. The scheme of the invention adopts an integrated power chip for voltage conversion, the integrated power chip has the advantages of high efficiency, low power consumption, low noise, high integration level and the like and does not need additional filter capacitors and inductors, the requirements of industrial grade test systems can be met, and only different EMCCD bases need to be designed for different types of EMCCDs.

Description

technical field [0001] The invention belongs to the technical field of low-light imaging, in particular to a general-purpose EMCCD (electron multiplication CCD) testing system. Background technique [0002] In recent years, CCD has been widely used in the fields of industrial vision, dimension measurement, aerospace and broadcast photography, and its application in the low-light field is becoming more and more mature. Twilight generally refers to relatively weak light at night or in low-light environment conditions or light with low energy that is not enough to cause human visual perception. Low-light imaging technology is a technology to detect the weak light emitted by the target, which is far lower than the normal illumination. Generally, the weak light conditions are enhanced in low-light environments or the weak optical signal of the target is directly obtained through the low-light imaging device, so that in the low-light environment In the light environment, relying ...

AI Technical Summary

Problems solved by technology

[0006] The research results of EMCCD at home and abroad show that the focus of research on EMCCD imaging systems in my country is the development of miniaturized cameras suitable for one type of chip. This imaging system cannot test different EMCCD chips, which has great limitations.

In addition, although many technical problems have been solved in the EMCCD chip manufacturing process in China in recent years, there is still a big gap compared with foreign developed countries, and there is a lack of general and reliable EMCCD chip testing equipment. Therefore, the development of multi-purpose EMCCD imaging systems The research and development of a general-purpose EMCCD test system has important practical significance for the study of miniaturized EMCCD cameras, the study of EMCCD color night vision technology, and the improvement of my country's EMCCD chip production process

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