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Test device for confirming electromagnetic performance of measured object

A technology for testing devices and objects under test, which is applied in the directions of electromagnetic field characteristics, measuring device casings, etc., to achieve the effects of dense distribution of data points, reliable testing results, and simple and convenient probe adjustment process.

Active Publication Date: 2018-06-08
SUNYIELD TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As we all know, as a planar near-field scan, in order to effectively derive the far field within a certain range, it must be sampled in the entire plane, and the sampling point spacing must be satisfied L<lambda / 2, where lambda is the wavelength of the radiation signal; and the current oversampling The method is only generally used in the spherical near field, and the oversampling technique has not been used in the planar near field test

Method used

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  • Test device for confirming electromagnetic performance of measured object
  • Test device for confirming electromagnetic performance of measured object
  • Test device for confirming electromagnetic performance of measured object

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0041] Embodiment 1: a kind of testing device for determining the electromagnetic performance of the object under test, such as figure 1 As shown, a box cover 11 is hinged on the box body 1, and the box cover 11 covers the box body 1 to form a closed detection space. In other embodiments, if the plane near-field test site has a darkroom or a shell with shielding function Body, the box body 1 may not be provided; the bottom of the box body 1 is fixed with a stage 2 for placing the measured object, and the two sides of the stage 2 are provided with brackets 3;

[0042] Such as figure 1As shown, the support 3 includes a stand 31 arranged on both sides of the object stage 2 and a sliding rod 32 slidingly connected to the stand 31, and the stand 31 is welded to the vertical rod 311 and the welding vertical rod 311 at the bottom of the box body 1 Composed of a cross bar 312 on the top of the cross bar 312, there is a notch for the slide bar 32 to slide, and a slider is fixed at bot...

Embodiment 2

[0050] Embodiment two: a kind of testing device for determining the electromagnetic properties of the measured object, such as Figure 9 with Figure 10 As shown, the difference from Embodiment 1 is that the limit assembly includes a limit protrusion 86 fixed on the inner rod 322, and the limit protrusion 86 is located near the outermost probe 4 and passes through the sliding groove 323 to Downward extension; in order to reduce the phenomenon that the rigid contact between the position-limiting protrusion 86 and the stand 31 causes damage to the position-limiting protrusion 86 and the stand 31, fix on the side of the position-limiting protrusion 86 facing the stand 31 There is a second elastic member 87, the second elastic member 87 adopts a spring, and the second elastic member 87 is aligned with the cross bar 312, so that when the outermost probe 4 is located near the stand 31, the second elastic member 87 can Collision on the crossbar 312;

[0051] When the inner rod 322 ...

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Abstract

The invention discloses a test device for confirming electromagnetic performance of a measured object and is to solve the problem that since over-sampling technique has not been used in plane near-field measurement in the prior art, measurement process is complex and measurement precision is low. The technical scheme is characterized in that the test device for confirming electromagnetic performance of the measured object comprises a box body, an objective table and a support. The support comprises stand frames and a slide bar. A plurality of probes are arranged in the axis direction of the slide bar. The test device also comprises a transverse driving device for driving the slide bar to move along the stand frames and an axial drive device for driving the plurality of probes to move simultaneously in the axis direction of the slide bar. The test device uses the plurality of probes to realize multi-point scanning on a plane each time; through two displacement devices, a fast scanning method for quickly constructing a plane field is provided; and the test device has the advantages of realizing oversampling of the measured object, easier and more convenient sampling process, more dense sampling data point distribution and more reliable detection result and the like.

Description

technical field [0001] The invention relates to the technical field of antenna testing, more specifically, it relates to a testing device for determining the electromagnetic performance of a measured object. Background technique [0002] When testing the electromagnetic performance of the antenna, it is necessary to detect multiple points of the object under test, and test multiple sets of data so that the electromagnetic performance of the object under test can be more comprehensively reflected. In order to improve the accuracy of the test results, Usually, an oversampling method is used to detect the measured object. As we all know, as a planar near-field scan, in order to effectively derive the far field within a certain range, it must be sampled in the entire plane, and the sampling point spacing must be satisfied L<lambda / 2, where lambda is the wavelength of the radiation signal; and the current oversampling The method is only generally used in the spherical near fi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/08G01R1/04
CPCG01R1/04G01R29/08
Inventor 韩栋
Owner SUNYIELD TECH CO LTD
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