A method for setting upper limit of integration time of emission spectrometer
A technology of integration time and setting method, which is applied in the field of emission spectrum analysis, can solve the problems of increased test time and test cost, poor transplantation effect, etc.
Active Publication Date: 2020-07-17
中控全世科技(杭州)有限公司
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[0008] However, the disadvantages of the above two schemes are: 1. Optimization and trial and error are required for different elements, different characteristic lines, and different concentrations, which increases the test time and test cost; 2. The transplantation effect of this scheme is poor, requiring Do a lot of repetitive testing
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[0030] The present invention will be further described in detail below through specific embodiments in conjunction with the accompanying drawings.
[0031] This example provides a method for setting the upper limit of the integration time of the emission spectrometer, preferably a calculation method for setting the upper limit of the integration time of the CCD detector when the detector of the emission spectrometer is a CCD detector. The flow chart is as follows figure 1 As shown, it specifically includes the following steps.
[0032] S1: Obtain the blank spectrum of an excitation light source under N different gradient integration time conditions, where N is greater than or equal to 2.
[0033] S2: Calculate the average blank spectrum under N different gradient integration time conditions.
[0034] In this step, M tests are performed on the blank spectrogram under each gradient integration time condition, that is, the test is repeated M times under each gradient integration...
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The invention discloses a calculation method for setting an upper limit of integration time of an emission spectrometer. The method comprises acquiring blank spectrums of an excitation source under Ndifferent gradient integration time conditions, calculating an average blank spectrum under N different gradient integration time conditions, carrying out linear regression fitting on average blank spectrum intensity Ib at different wavelengths and integration time T to obtain a blank background spectral time proportional coefficient kd and a background constant bd, setting an upper limit Fs of aCCD detector measuring range, setting a detection limit confidence coefficient t, setting a light source blank spectrum fluctuation level characteristic value [RSD]b, setting the multiple alpha of a measuring range upper limit and an estimation detection limit of an element to be detected, and calculating the integration time upper limit according to the formula. The method can realize computer aid calculation through a formula, is free of manual operation, only test the blank spectrums of the excitation source under different gradient integration time conditions once and is free of integration condition optimization of different elements under different characteristic spectral lines and different concentrations.
Description
technical field [0001] The invention relates to the technical field of emission spectrum analysis, in particular to a method for setting the upper limit of the integration time of an emission spectrometer. Background technique [0002] Emission spectroscopy is an analytical chemical method for precise quantification based on the linear relationship between the concentration of the element to be measured and the intensity of the characteristic spectral line it emits. Generally, the elements in the sample are excited by plasma to emit characteristic spectral lines, which are collected into the spectroscopic detection system through the front optical path to cause dispersion in space, and are photoelectrically converted by the detector to finally obtain the full spectrum picture. [0003] Inductively coupled device CCD is a common photoelectric conversion device, often used as a detector for spectroscopic detection systems, such as micro-fiber spectrometers, echelle grating sp...
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IPC IPC(8): G01N21/73
CPCG01N21/73
Inventor 于丙文黄新宇常红旭郑磊落陈挺郭淳
Owner 中控全世科技(杭州)有限公司