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System and method for evaluating performance of chip through collaboration of multiple processors

A chip performance, multi-processor technology, applied in the direction of electrical digital data processing, instruments, electronic circuit testing, etc., can solve the problems of increasing maintenance difficulty, inability to accurately test chips, and restricting test efficiency, so as to achieve the effect of improving test efficiency

Active Publication Date: 2018-06-29
HEFEI CHIPSEA ELECTRONICS TECH CO LTD
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  • Abstract
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Problems solved by technology

It is impossible to solve the defects in the existing chip testing, such as inability to accurately test various index items of the chip, inability to provide a more accurate signal source for the tested chip, complex peripheral circuits, high hardware cost and increased maintenance difficulty, which restricts the improvement of test efficiency

Method used

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  • System and method for evaluating performance of chip through collaboration of multiple processors
  • System and method for evaluating performance of chip through collaboration of multiple processors
  • System and method for evaluating performance of chip through collaboration of multiple processors

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Embodiment Construction

[0065] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0066] figure 1 , figure 2 As shown, it is the multi-chip performance index evaluation system of multi-processor coordinated control realized by the present invention. The system can control multi-chips to perform performance index parameter test and evaluation in the R&D and design stage, and use PC control software as the man-machine interface. The test method integrates various types of index tests in a system to test and evaluate the chip, which greatly improves the test efficiency. The system consists of open and short circuit detection module, USB communication processing module, PMU contr...

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Abstract

The invention discloses a system for evaluating the performance of a chip through the collaboration of multiple processors. The system comprises an open short circuit detection module, a USB communication processing module, a PMU control module, a signal scanning module, a voltage control module, a frequency measurement module, a test index evaluating module and an expansion measurement module. The performance indexes and the parameters of multiple chips are controlled to be tested and evaluated on the research and design stage, PC controlled software is taken as a man-machine interface, multiple types of index tests are integrated on one system through synchronous testing to test and evaluate the chip, and the testing efficiency is greatly improved.

Description

technical field [0001] The invention belongs to the technical field of chip testing, and in particular relates to a system and a method for dual-processor control and simultaneous testing of multiple groups of tested chips. Background technique [0002] At present, many key analog indicators of the chip are not tested in an integrated manner in the R & D and design stage, and multiple performance indicators are tested in multiple systems or the test efficiency is not high, which brings great inconvenience to the implementation of the test work; the measurement of the system Due to low precision and differences in the accuracy of test data, there are problems of mismeasurement and misjudgment. In addition to the influence of factors such as chip design, process and packaging, the signal accuracy required by the system to supply the chip is not enough. There are some troubles; the design method of single processor structure can only be tested serially due to its structure, and...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G06F15/173
CPCG01R31/2856G06F15/17337
Inventor 庞新洁
Owner HEFEI CHIPSEA ELECTRONICS TECH CO LTD
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