Gate driver monolithic (GDM)

A driving circuit and gate scanning technology, which is applied in the direction of instruments and static indicators, etc., can solve the problems of weak maintenance ability of the driving circuit unit, false opening of the scanning signal Gn, and influence on the pull-up control node, so as to save layout space and improve Circuit reliability, effect of preventing narrowing of signal pulse width

Active Publication Date: 2018-07-03
NANJING CEC PANDA LCD TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This phenomenon will affect the function of the pull-up control node maintenance module 4, resulting in a weak maintenance capability of the drive circuit unit after outputting the scan signal Gn, which may cause the scan signal Gn to be turned on by mistake, resulting in poor circuit reliability

Method used

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  • Gate driver monolithic (GDM)
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  • Gate driver monolithic (GDM)

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0062] Such as Figure 6 Shown is a circuit diagram of Embodiment 1 of a gate scanning drive circuit, the nth level drive circuit unit includes a pull-up control module 1, a pull-up module 2, a maintenance control node generation module 3, a pull-up control node maintenance module 4, The output node maintains the module 5 and the bootstrap capacitor C1.

[0063]The pull-up control module 1, the pull-up module 2, the maintenance control node generation module 3 and the pull-up control node maintenance module 4 are connected to the pull-up control node netAn; the maintenance control node generation module 3, the pull-up control node maintenance module 4 and the output The node maintenance modules 5 all input low-level VSS; the pull-up module 2 and the output node maintenance module 5 are connected to the scanning signal line of the current stage, and the scanning signal line outputs the scanning signal Gn; the maintenance control node generation module 3 and the pull-up control ...

Embodiment 2

[0108] Figure 9 It is a schematic circuit diagram of Embodiment 2 of a gate scanning driving circuit of the present invention. The second embodiment is improved on the basis of the first embodiment, and the specific improvements are as follows:

[0109] The sustain control node generation module 3 further includes a fourteenth thin film transistor M6A and a fifteenth thin film transistor M6B.

[0110] The control terminal of the fourteenth thin film transistor M6A inputs the first control signal, and the two pass terminals of the fourteenth thin film transistor M6A are respectively connected to the sustain control node netBn of the nth driver circuit unit and the reverse scan control signal D2U. The fourteenth thin film transistor M6A is used to prohibit and maintain the output of the control node netBn during the working period of the n-2th stage circuit unit in the forward scan process, that is, during the precharge phase of the forward scan.

[0111] The control terminal...

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PUM

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Abstract

The invention discloses a gate driver monolithic (GDM) including N (N>4, and N is a positive integer) levels of driving circuit units. The nth(1< / =n< / =N, and n is a positive integer)-level driving circuit unit includes a pull-up control module, a pull-up module, a maintenance control node generation module, a pull-up control node maintenance module, and an output node maintenance module. The maintenance control node generation module inputs a forward scan control signal and a reverse scan control signal that are mutually inverted, and generates a maintenance control signal to control a maintenance control node, after the output of scan signals in the forward scan and the reverse scan, the first signal pulse width of the maintenance control node is the same as the preset width, the first pulse width of the maintenance control node is prevented from being narrowed, so that the pull-up control node maintenance module can immediately perform intermittent low-potential maintenance on a pull-up control node, the scan signal is prevented from being erroneously turned on, and the circuit reliability is improved.

Description

technical field [0001] The invention relates to the field of liquid crystal display, in particular to a grid scanning driving circuit. Background technique [0002] The gate scanning lines of flat panel displays were generally driven by integrated circuit chips (Gate IC) before, and the integrated gate scanning drive circuit (Gate Driver Monolithic, GDM) is a method that utilizes the existing manufacturing process of thin film transistor array substrates. The technology in which the gate scanning driving circuit is directly built on the array substrate has the functions of reducing cost, reducing process flow, and reducing the width of the panel frame. With the development of products and technologies, flat panel displays have higher and higher requirements for gate scanning driving circuits, one of which is to have forward scanning and reverse scanning functions at the same time. [0003] Such as figure 1 As shown, it is a schematic circuit diagram of an existing bidirect...

Claims

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Application Information

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IPC IPC(8): G09G3/36
CPCG09G3/3674G09G3/20G09G3/3677G09G2310/0267G09G2310/0286
Inventor 戴超夏迪黄洪涛
Owner NANJING CEC PANDA LCD TECH
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