Dual-wavelength radiation temperature measurement device and method

A radiation temperature measurement and dual-wavelength technology, applied in the field of optical measurement, can solve the problems of limited gray body surface temperature, large single-color temperature measurement measurement error, and difficult to determine emissivity, etc., to achieve convenient error evaluation and prediction, high-precision measurement, The effect of temperature measurement error reduction

Active Publication Date: 2018-07-06
CHINA UNIV OF MINING & TECH
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Problems solved by technology

The signal-to-noise ratio of multi-wavelength temperature measurement is low, the emissivity behavior is difficult to determine, the stability of temperature inversion is poor, and the measurement error of monochromatic temperature measurement may be large under the condition of unknown emissivity
The colorimetric thermometry method based on dual-wavelength radiation measurement has the advantages of both, but is limited to the measurement of gray body surface temperature

Method used

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  • Dual-wavelength radiation temperature measurement device and method
  • Dual-wavelength radiation temperature measurement device and method
  • Dual-wavelength radiation temperature measurement device and method

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Embodiment Construction

[0041] The present invention will be further explained below in conjunction with the accompanying drawings.

[0042] Such as figure 1 As shown, a dual-wavelength radiation temperature measuring device of the present invention includes an optical lens, a semi-transparent and semi-reflective spectroscopic system, a monochromatic color filter a, a sensor a, a data acquisition and analysis unit and an error evaluation system, a sensor b and a monochromatic color filter b.

[0043] The optical lens is used to focus the radiation beam of the object to be measured on the semi-transparent and semi-reflective spectroscopic system. The transflective beam splitting system includes a transflective beam splitter and a collimator, the transflective beam splitter is used to divide the radiation beam into a transmitted beam and a reflected beam, and the collimator is used to collimate the transmitted beam and the reflected beam. The monochromatic color filter a is used to correct the color...

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Abstract

The invention discloses a dual-wavelength radiation temperature measurement device and method. The device comprises an optical lens used for focusing radiation light beams of a to-be-measured object on a semi-transmitting semi-reflecting beam splitting system. The semi-transmitting semi-reflecting beam splitting system comprises a semi-transmitting semi-reflecting beam splitting piece used for splitting the radiation light beams into transmitting light beams and reflecting light beams, the transmitting light beams and the reflecting light beams are received by sensors, and optical radiation measuring signals are generated. A data acquisition and analysis unit and an error evaluation system calculate the temperature value of the to-be-measured object according to the optical radiation measuring signals, and the temperature value error is predicted and evaluated. The method includes the following steps that looseness approach is carried out to acquire a corrected dual-wavelength temperature; single-color probability approach is carried out to acquire a single-color probability average temperature; averaging is carried out to acquire the average of the corrected dual-wave-length temperature and the single-color probability average temperature. High-precision measurement of gray body surface or non-gray surface temperatures is achieved under the condition that emissivity behaviorsare unknown, and the error can be conveniently evaluated and predicted based on the measured temperatures.

Description

technical field [0001] The invention relates to optical measurement technology, in particular to a device and method suitable for measuring the surface temperature of an object with non-gray body characteristics without colorimetric solution. Background technique [0002] In petrochemical, metallurgy, steel, cement, glass, power plants and other industrial production fields, temperature measuring instruments based on radiation measurement have huge market demand and broad application prospects. In these application fields, the traditional thermocouple contact temperature measurement method is gradually being replaced by non-contact optical temperature measurement equipment with lower price and more stable performance due to the limitation of measurement and high cost of material consumption. The signal-to-noise ratio of multi-wavelength temperature measurement is low, the emissivity behavior is difficult to determine, the stability of temperature inversion is poor, and the m...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00
CPCG01J5/00
Inventor 辛成运刘忠鑫路朗
Owner CHINA UNIV OF MINING & TECH
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