A Temperature Compensation Circuit for Measuring Signal

Abstract

The invention discloses a temperature compensation circuit for measurement signals, which includes a measurement signal sampling module, a signal compensation module, a compensation coefficient selection module, a temperature compensation offset module, a positive temperature coefficient output voltage generation module and a negative temperature coefficient output voltage generation module. The measurement signal sampling module samples the input measurement voltage; the signal compensation module judges its positive and negative characteristics according to the measured value, and controls the compensation coefficient selection module to select a correction voltage with opposite characteristics as the reference voltage output; and judges whether the reference voltage can be compensated If the measured voltage can, output the compensated output voltage; otherwise, set the offset value of the temperature compensation offset module so that the reference voltage can compensate the measured voltage. By using the temperature compensation circuit of the invention, the complexity of the system can be reduced, the cost can be reduced, and the temperature adaptation range of the test system can be improved.

Description

technical field [0001] The invention relates to the technical field of semiconductor integrated circuits, in particular to a temperature compensation circuit for measuring signals. Background technique [0002] In the test system, the measurement signal is easy to change with the temperature, causing the measurement results to output different measurement values ​​under different temperature environments. In the prior art, an ADC (Analog to Digital Converter, analog-to-digital converter) measurement scheme is usually used. After the temperature is tested, the required compensation value is calculated according to the current test temperature, and then the compensation coefficient configuration is selected by looking up the table. Due to the error INL (Integral nonlinearity, integral nonlinearity) / DNL (Differential nonlinearity, differential nonlinearity) of the ADC itself, temperature measurement requires software correction, which increases the complexity and cost of the sy...

AI Technical Summary

Problems solved by technology

Due to the error INL (Integral nonlinearity, integral nonlinearity) / DNL (Differential nonlinearity, differential nonlinearity) of the ADC itself, temperature measurement requires software correction, which increases the complexity and cost of the system

And the sampling clock of the ADC introduces switching noise to the system, causing errors in the high-precision test system

[0003] Therefore, the existing temperature compensation scheme needs to add an additional temperature test circuit in the measurement system, which increases the complexity and cost of the system, and also requires more software correction time, which increases the test cost

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