Test optimization selecting method considering key failures

A technology of critical faults and optimal selection, applied in design optimization/simulation, constraint-based CAD, complex mathematical operations, etc., can solve the problems of safe system operation and subsequent maintenance burden, critical faults cannot be detected and isolated, etc.

Active Publication Date: 2018-08-03
NAVAL AVIATION UNIV
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Problems solved by technology

Although the optimal solution searched by the above algorithm can minimize the test cost and meet the testability index requirements, the abandonment of some tests may cause some critical faults with a small probability to be unable to be detected and isolated, thereby affecting the safe operation and operation of the system. Subsequent maintenance poses a serious burden

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  • Test optimization selecting method considering key failures
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  • Test optimization selecting method considering key failures

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Embodiment

[0065] Taking the superheterodyne receiver system as an example, its fault-test correlation matrix is ​​shown in Table 1, t 1 ~t 36 For 36 tests, f 1 ~ f 22 represent 22 failures respectively.

[0066] Table 1 Fault-test correlation matrix of superheterodyne system

[0067]

[0068] Table 2 shows the prior probability of each fault and the three key faults of the system, assuming that the test cost of each alternative test is 1.

[0069] Table 2 System failure prior probability and key failures

[0070] Fault

[0071] It is stipulated that the fault detection rate and fault isolation rate of the system shall not be lower than 95%, and the critical fault detection rate and critical fault isolation rate shall not be lower than 98%. The remaining parameters are: M=60, ω max = 1.2, ω min =0.4,N max =200, α=β=γ=0.5, c 1 =c 2 =c 3 = 1.4962. After 30 independent calculations, the number of iterations in each calculation process is 200 times, and the final par...

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Abstract

The invention discloses a test optimization selecting method considering key failures. The method includes the steps of obtaining a failure-test relevance matrix, establishing an optimization model, solving the optimization model and the like. According to the method, from the angle of system security, the importance of the key failures is analyzed; then based on the relevance matrix, with the test price minimization as the optimization target, with the failure detection rate and isolation rate and the key failure detection rate and isolation rate as the constraints, the test optimization selecting model considering the key failures is established; finally, solution is conducted by means of a binary particle swarm algorithm based on mass center improvement and inertia weight self-adaptiveadjustment. The severe threats caused by key failure detection omission to device security can be effectively eliminated.

Description

technical field [0001] The invention belongs to the technical field of testing and fault diagnosis, and relates to a test optimization selection method considering key faults. Background technique [0002] With the continuous improvement of the complexity of electronic equipment, problems such as poor testability, high test cost and difficult test diagnosis are gradually exposed in use. An important task of test diagnosis is test optimization selection, that is, to select a set of test sets that meet the testability parameter index requirements in the set of all possible tests in the system, and at the same time, the test cost is the smallest. The test optimization selection problem is a typical set covering and combinatorial optimization problem, which is difficult to solve. Commonly used greedy algorithms, AND-OR graph search algorithms, and AO* methods have problems such as high computational complexity, local convergence, and combinatorial explosion, making it difficult...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50G06F17/16G06N3/00
CPCG06F17/16G06N3/006G06F2111/04G06F30/333G06F30/20
Inventor 马羚叶文吕晓峰王凤琴刘瑜汪兴海吕鑫燚
Owner NAVAL AVIATION UNIV
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