Method for building winter wheat full-rot disease index prediction models on basis of spectral indexes and application
A spectral index and prediction model technology, applied in data processing applications, color/spectral characteristic measurement, prediction, etc., can solve the lack of application of fine spectral characteristic information of winter wheat diseases, omission and misjudgment of non-monitoring areas or atypical characteristic areas , affecting data accuracy and timeliness, etc., to achieve the effect of easy promotion and application, improvement of application potential, and high precision
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[0065] Test Ⅰ Overview: The test was conducted on May 21, 2017 in Peicheng Town, Yancheng District, Luohe City, Henan Province (33°43'11.08"N~33°43'11.83"N, 113°49'58.43"E~113°50' 2.58"E, 61m above sea level), the test area is 112m long and 26m wide, and the main soil type is fluvo-aquic soil. The experimental area is a wheat and corn rotation area. The wheat variety used for the test is Aikang 58. The sowing date is October 12, 2016. The cultivation measures during the wheat growth period are the same as those in the general high-yield fields.
[0066] The specific modeling method is as follows. The instruments and equipment involved are conventional instruments and equipment unless otherwise specified; the industrial raw materials involved are commercially available conventional industrial raw materials unless otherwise specified.
[0067] (1) Disease level investigation
[0068] The white ear characteristics of winter wheat infected by take-all disease during the grain fil...
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