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Electron microscope observation metal polishing clamp

A metal and fixture technology, applied in the field of microscope sample preparation tools, can solve the problems of unqualified samples, low efficiency, waste of materials and time, etc., and achieve the effects of improving sample preparation efficiency, ensuring success rate, and convenient operation

Pending Publication Date: 2018-09-11
CHONGQING UNIVERSITY OF SCIENCE AND TECHNOLOGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Using the existing technology to prepare such a metal sample, it is mostly manually held, and the thickness difference of the metal sample before and after grinding is measured by a vernier caliper. This method often cannot grasp the thickness of the sample well (the grinding plane is inclined, the grinding thickness is too much), resulting in The sample is unqualified, which makes the observation result unsatisfactory, wastes materials and time, and may even cause operator injury due to operating errors
Therefore, a tool for assisting metal sample grinding is needed to solve the problems of low quality and low efficiency of sample grinding

Method used

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  • Electron microscope observation metal polishing clamp
  • Electron microscope observation metal polishing clamp
  • Electron microscope observation metal polishing clamp

Examples

Experimental program
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Embodiment Construction

[0020] The present invention will be further described below in conjunction with the embodiments and drawings.

[0021] As attached Figure 1~3 As shown, an electron microscope observation metal grinding fixture includes a fixed sleeve 1 with open front and rear ends. The fixed sleeve 1 is provided with a sample preparation table 2 in the cylinder body, and the fixed sleeve 1 and the sample preparation table 2 are threaded Connected, the sample preparation table 2 is provided with a sample bayonet 3 on the front end, a suction cup hole is provided at the bottom of the sample bayonet 3, a sample suction cup 7 is fixed in the suction cup hole, and the suction nozzle of the sample suction cup 7 is set outward The sample suction cup 7 extends out of the suction cup hole and then enters the bottom of the sample bayonet 3.

[0022] The back end of the sample preparation table 2 extends out of the rear of the fixing sleeve 1, and the end of the sample preparation table 2 facing away from...

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Abstract

The invention discloses an electron microscope observation metal polishing clamp comprising a fixing sleeve with the front end and the back end being open. A sample manufacturing platform is arrangedin a cylinder of the fixing sleeve. The fixing sleeve is connected with the sample manufacturing platform in a threaded manner. The sample manufacturing platform extends and retracts front and back along the fixing sleeve. The front end face of the sample manufacturing platform is provided with a sample bayonet. The electron microscope observation metal polishing clamp is simple in structure and convenient to operate, a user can accurately master the thickness of the sample in the sample manufacturing process, the sample manufacturing efficiency is greatly improved, and the sample manufacturing success rate is guaranteed to a great extent.

Description

Technical field [0001] The invention relates to a microscope sample preparation tool, in particular to an electron microscope observation metal grinding fixture. Background technique [0002] When observing metal samples with transmission electron microscope and scanning electron microscope, it is necessary to polish the metal sample to remove a certain thickness or obtain a metal sample with a smooth surface. The existing technology is used to prepare such metal samples, which are mostly manually controlled, and the thickness difference of the metal samples before and after the polishing is measured by a vernier caliper. This method often fails to grasp the sample thickness well (the polishing plane is inclined, and the polishing thickness is too large), resulting in The sample is unqualified, which makes the observation result unsatisfactory, wastes materials and time, and may even cause injury to the operator due to operating errors. Therefore, a tool for assisting the polish...

Claims

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Application Information

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IPC IPC(8): B24B41/06G01N1/28G01N23/2202
CPCG01N1/286G01N23/2202B24B41/06G01N2001/2866
Inventor 栗克建中里福和邵斌陈丽萍吴旭牛振国
Owner CHONGQING UNIVERSITY OF SCIENCE AND TECHNOLOGY
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