Laser induced plasma parameter characterization method based on self-absorption quantification of spectral line

A plasma and laser-induced technology, which is applied in the field of laser-induced plasma parameter characterization based on spectral line self-absorption quantification, can solve the problem that the interaction between laser and matter reduces the practicability of LIBS quantitative analysis, so as to avoid self-absorption effect and prolong Calibrate cycle, avoid unwanted effects

Inactive Publication Date: 2018-09-25
SHANXI UNIV
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Problems solved by technology

However, the above existing methods rely on ideal assumptions or approximate models to correct the intensity of self-absorption lines, or add devices to reduce the self-absorption effect of specific lines, wh

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  • Laser induced plasma parameter characterization method based on self-absorption quantification of spectral line
  • Laser induced plasma parameter characterization method based on self-absorption quantification of spectral line
  • Laser induced plasma parameter characterization method based on self-absorption quantification of spectral line

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[0031] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments.

[0032] In the description of the present invention, it should be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", " The orientation or positional relationship indicated by “outside” is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation to The specific azimuth structure and operation cannot be understood as a limitation of the present invention.

[0033] Refer to f...

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Abstract

The invention discloses a laser induced plasma parameter characterization method based on self-absorption quantification of a spectral line. The self-absorption degree of the spectral line is quantified by measuring the line width of the element spectral line so as to obtain plasma parameters such as electron temperature, element content ratio and particle absolute number density. Because the calculation process of the method has no need of using spectral line intensity, adverse influences caused by the self-absorption effect during traditional calculation of the plasma parameters based on thespectral line intensity are avoided, and the spectral efficiency of a detector does not need to be corrected so as to effectively prolong the calibration period of LIBS (Laser-Induced Breakdown Spectroscopy) detection equipment and directly and accurately characterize the plasma parameters.

Description

Technical field [0001] The invention belongs to the technical field of laser spectrum analysis and detection methods, and specifically relates to a method for characterizing laser-induced plasma parameters based on spectral line self-absorption quantification. Background technique [0002] Laser-induced breakdown spectroscopy (LIBS) technology obtains the elemental composition and relative abundance information of the sample by analyzing the plasma radiation generated by high-energy pulsed laser bombardment of the sample. It has a wide range of applications in industrial analysis, environmental monitoring, biomedicine and other fields. However, the self-absorption effect existing in the quantitative analysis of LIBS will not only reduce the intensity of the element emission line and increase the line width, but also have a nonlinear effect on the quantitative analysis results and reduce the detection accuracy. Therefore, how to eliminate the influence of self-absorption is the ke...

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Application Information

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IPC IPC(8): G01N21/71
CPCG01N21/718
Inventor 侯佳佳张雷尹王保肖连团贾锁堂
Owner SHANXI UNIV
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