Test substrate and its preparation method, detection method, display substrate, display device

Abstract

Embodiments of the present invention provide a test substrate and its preparation method, detection method, display substrate, and display device, which relate to the field of display technology and can improve the problem in the prior art that the source charging and discharging speed is affected during simulation due to excessive total capacitance , which can also improve the accuracy of the simulation results. A test substrate, including a substrate, including a first electrode layer, a pixel defining layer, a light-emitting functional layer, and a second electrode layer sequentially arranged on the substrate; wherein, the pixel defining layer is used to define a plurality of opening regions, The first electrode layer includes a plurality of first electrodes; the area where the projections of each first electrode and the second electrode layer overlap on the substrate is the area where a test unit is located; in each test unit, the pixel defining layer and the light emitting function The area where the projections of the layers overlap on the substrate is the first area; in at least two test units, the areas of the first electrodes located in the first area are different.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a test substrate, a preparation method thereof, a detection method, a display substrate, and a display device. Background technique [0002] In recent years, due to the advantages of self-luminescence, wide viewing angle, short response, high luminous efficiency, wide color gamut, and low operating voltage, organic light emitting diodes (OLEDs) have become very popular emerging flat-panel displays at home and abroad. [0003] However, since the size of the OLED capacitor plays an important role in the change of the source voltage of the drive transistor (Thin Film Transistor, DriveTFT for short), the larger the OLED capacitor is, the slower the source voltage is charged and discharged. [0004] At present, the OLED capacitance directly measured by the OLED life time cell (LTC) contains a large part of parasitic capacitance. When the OLED capacitance directly measured by the OLED...

AI Technical Summary

Problems solved by technology

[0006] Embodiments of the present invention provide a test substrate and its preparation method, detection method, display substrate, and display device, which can improve the problem in the prior art that the total capacitance is too large, which affects the charging and discharging speed of the source during simulation, and improve the simulation results. the accuracy of

Images