Measuring Method of Detector Angle Deviation in Cone Beam CT System Based on Feature Texture Template

A technology of angle deviation and detector, which is applied in the field of computer tomography, can solve the problems of difficult template making and complicated measurement operation steps, and achieve the effect of solving complicated template making, easy template making, and complicated measurement operation

Active Publication Date: 2019-08-20
DALIAN UNIV OF TECH
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  • Abstract
  • Description
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Problems solved by technology

The template of this method is easy to make, and the measurement steps are simple, which solves the problems of difficult template making and complicated measurement steps.

Method used

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  • Measuring Method of Detector Angle Deviation in Cone Beam CT System Based on Feature Texture Template
  • Measuring Method of Detector Angle Deviation in Cone Beam CT System Based on Feature Texture Template
  • Measuring Method of Detector Angle Deviation in Cone Beam CT System Based on Feature Texture Template

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Embodiment

[0068]The ray source is a COMMET ray source, and the PaxScan 1313DX detector is used to collect projection images with a resolution of 1024×1024, a pixel size of 0.127mm, and a Gigabit Ethernet interface. The estimated distance from the ray source to the detector is 1000mm. The texture on the calibration template is the superposition of checkerboard texture and concentric ring texture. The size of the template is 100mm×100mm, the checkerboard is 10×10, the length and width of each small square are 8mm, and there are 5 concentric rings in total. , taking the center of the checkerboard as the center, the minimum radius is 8mm, other radii are based on the minimum radius, and the interval is 8mm. The width of each line on the template is 1mm.

[0069] Step 1. Obtain the projection image of the calibration template and determine the initial value. The initial value of the angle parameter θ x =0,θ y =0,θ z =0, the initial value of the normalized displacement parameter

[00...

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Abstract

The invention provides a measurement method of angle deviation of a cone beam CT system detector, based on a feature texture template, and belongs to the technical field of computed tomography in thefield of image processing. The method is characterized in that a specific template comprising rotational symmetry texture and translational symmetry texture is adopted to establish relationship between the angle deviation of the detector and two types of texture images, so that the angle deviation of the detector is solved. The method has the effects and benefits that a calibration template with feature textures is adopted to collect single-angle projection data to obtain the angle deviation of the cone beam CT system detector, the template is easy to manufacture, the method is simple to operate, and the problems that the template is difficult to manufacture and measurement operation is complex are solved.

Description

technical field [0001] The invention belongs to the technical field of computer tomography (CT) in the field of image processing, and relates to a method for measuring the angle deviation of a detector of a cone-beam CT system by using a calibration template with a characteristic texture. Background technique [0002] The geometric angle deviation correction of computer tomography (Computed Tomography, CT) system is one of the basic problems to be solved in the field of CT research. Industrial X-ray CT system, as a testing device, can perform non-destructive testing on the dimensions, defects and features inside the object to be tested. In an industrial CT system, the ray source is an X-ray source, and the emitted light is a cone beam. The cone beam CT system requires that the detector has no angular deviation under the ideal imaging relationship. However, during the installation process of the industrial CT system, the detector will inevitably produce angular deviation, a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/046
Inventor 孙怡杜勇
Owner DALIAN UNIV OF TECH
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