Testing system and method for batch production of chips

Abstract

The invention provides a testing system and method for the batch production of chips, and the system comprises a hard core processor system unit, a ping-pong buffer unit and a vector comparison unit,wherein the hard core processor system unit is used for reading test vector data from an external memory. The ping-pong buffer unit is used for reading the test vector data from the hard core processor system unit at a high speed, caching the read test vector data, and outputting the test vector data to the vector comparison unit at a low speed. The vector comparison unit is used for receiving thetest vector data outputted by the ping-pong buffer unit, outputting the received test vector data to a to-be-tested chip, receiving the expected vector data generated by the to-be-tested chip, and comparing the expected vector data with the test vector data to generate a test result of the to-be-tested chip. Due to the large storage space of the external memory, the problem that a built-in RAM ofan FPGA cannot store the test vector can be solved.

Description

technical field [0001] The invention relates to the technical field of mass production testing, and more specifically, to a chip mass production testing system and method. Background technique [0002] Mass production testing is mainly used to verify whether the chip can complete the work or function expected by the design, and it is a necessary step before the large-scale supply of the chip. For the existing digital-analog hybrid chip, it is not only necessary to test the analog part, but also to test the digital part. Moreover, for chips with many digital logic units, digital vector scan chain tests must be done to improve the supply yield of chip products. [0003] In mass production testing, small-scale test vectors only need to be stored in a RAM (random access memory, random access memory) built into a testing machine, that is, an FPGA (Field Programmable Gate Array, Field Programmable Gate Array). However, as the integration level of the chip becomes higher and high...

AI Technical Summary

Problems solved by technology

[0004] In view of this, the present invention provides a chip mass production test system and method to solve the problem that the existing FPGA built-in RAM cannot store test vectors

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