Electronic circuit emi sensitive area positioning measurement system and positioning measurement method based on near-far field transformation algorithm

Abstract

The invention provides a positioning measurement system and method for an electronic circuit EMI sensitive region based on a near-far field transformation algorithm. The method comprises the steps that a data processing work station transmits a target point location instruction to a two-dimensional scanning platform; the two-dimensional scanning platform enables a detection antenna of a port detector to move to a target point location of a scanning platform, precisely records the real-time coordinates of the detection antenna and transmits the real-time coordinates of the detection antenna tothe data processing work station; the data processing work station transmits an instruction for reading the complex amplitude of a relative electric field between the detection antenna and a referenceantenna at the point location where the detection antenna to the port detector; the port detector measures the complex amplitude of the relative electric field at the point location where the detection antenna, and uploads a measurement value to the data processing work station; the data processing work station carries out the integrated calculation of the position coordinates of a sampling pointscanned in a scanning plane and the parameters of the electric field at the point based on the near-far field transformation algorithm after the data is obtained, and deduces the electromagnetic field distribution of a detected electronic system in a to-be-detected plane. The system is simple in structure, is high in calculation speed, and is low in cost.

Description

technical field [0001] The invention belongs to the technical field of electromagnetic compatibility, and in particular relates to a positioning measurement system and a positioning measurement method for an EMI sensitive area of ​​an electronic circuit based on a near-far field transformation algorithm. Background technique [0002] With the development of electronic circuit systems on the market in the direction of complexity and high speed, the accompanying EMI (Electromagnetic Interference, electromagnetic interference) problem has gradually attracted the attention of the industry. In terms of cost, it is difficult to meet the objective needs of the current electronics industry. For newly designed high-speed circuit systems (such as FPGA, complex controllers and radio frequency electronic modules), designers urgently need a detection method that can quickly detect the EMI distribution characteristics of the circuit system, and provide guidance for further system optimiza...

AI Technical Summary

Problems solved by technology

[0002] With the development of electronic circuit systems on the market in the direction of complexity and high speed, the accompanying EMI (Electromagnetic Interference, electromagnetic interference) problem has gradually attracted the attention of the industry. It is difficult to meet the objective needs of the current electronics industry in terms of cost

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